Christopher L. Claypool

Person

Carlsbad, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Spectroscopic ellipsometry system for thin film imaging
- Patent number 11,668,645
- Issue date Jun 6, 2023
- Bruker Nano, Inc.
- Emad Zawaideh
- G02 - OPTICS
Information Patent Grant
Imaging spectropolarimeter
- Patent number 11,499,870
- Issue date Nov 15, 2022
- Bruker Nano, Inc.
- Mazen Zawaideh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for measurement of through silicon structures
- Patent number 9,305,341
- Issue date Apr 5, 2016
- Christopher L. Claypool
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel surface plasmon resonance instrument
- Patent number 8,330,959
- Issue date Dec 11, 2012
- Christopher L. Claypool
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROSCOPIC ELLIPSOMETRY SYSTEM FOR THIN FILM IMAGING
- Publication number 20230324283
- Publication date Oct 12, 2023
- Bruker Nano, Inc.
- Emad Zawaideh
- G01 - MEASURING TESTING
Information Patent Application
Imaging Spectropolarimeter and Sample Characterization Methodology...
- Publication number 20230057928
- Publication date Feb 23, 2023
- Bruker Nano, Inc.
- Mazen Zawaideh
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic ellipsometry system for thin film imaging
- Publication number 20230010806
- Publication date Jan 12, 2023
- Scientific Computing International
- Emad Zawaideh
- G01 - MEASURING TESTING
Information Patent Application
Imaging Spectropolarimeter
- Publication number 20200191657
- Publication date Jun 18, 2020
- Mazen Zawaideh
- G01 - MEASURING TESTING
Information Patent Application
Imaging spectropolarimeter
- Publication number 20160076942
- Publication date Mar 17, 2016
- SCI INSTRUMENTS, INC (DBA) SCIENTIFIC COMPUTING INTERNATIONAL
- Mazen Zawaideh
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASUREMENT OF THROUGH SILICON STRUCTURES
- Publication number 20130148877
- Publication date Jun 13, 2013
- Christopher L. Claypool
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL SURFACE PLASMON RESONANCE INSTRUMENT
- Publication number 20100238443
- Publication date Sep 23, 2010
- Christopher L. Claypool
- G01 - MEASURING TESTING

Christopher L. Claypool

Person

Patents Grantslast 30 patents

Spectroscopic ellipsometry system for thin film imaging

Imaging spectropolarimeter

System and method for measurement of through silicon structures

Multi-channel surface plasmon resonance instrument

Patents Applicationslast 30 patents

SPECTROSCOPIC ELLIPSOMETRY SYSTEM FOR THIN FILM IMAGING

Imaging Spectropolarimeter and Sample Characterization Methodology...

Spectroscopic ellipsometry system for thin film imaging

Imaging Spectropolarimeter

Imaging spectropolarimeter

SYSTEM AND METHOD FOR MEASUREMENT OF THROUGH SILICON STRUCTURES

MULTI-CHANNEL SURFACE PLASMON RESONANCE INSTRUMENT