Christopher L. Lichtenberg

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Houston, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring frequency and phase difference
- Patent number 4,818,999
- Issue date Apr 4, 1989
- The United States of America as represented by the administrator of the Natio...
- Herbert S. Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring distance
- Patent number 4,757,315
- Issue date Jul 12, 1988
- The United States of America as represented by the administrator of the Natio...
- Christopher L. Lichtenberg
- G01 - MEASURING TESTING