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Christopher L. Wooten
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for identifying broken pins in a test socket
Patent number
8,040,140
Issue date
Oct 18, 2011
GLOBALFOUNDRIES, INC.
Matthew S. Ryskoski
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for accurate alignment of integrated circuit i...
Patent number
6,593,168
Issue date
Jul 15, 2003
Advanced Micro Devices, Inc.
Edward E. Ehrichs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for measuring cumulative defects
Patent number
6,487,511
Issue date
Nov 26, 2002
Advanced Micro Devices, Inc.
Christopher L. Wooten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor wafer review system and method
Patent number
6,401,008
Issue date
Jun 4, 2002
Advanced Micro Devices, Inc.
Edward E. Ehrichs
G01 - MEASURING TESTING
Information
Patent Grant
Interlayer between titanium nitride and high density plasma oxide
Patent number
6,271,112
Issue date
Aug 7, 2001
Advanced Micro Devices, Inc.
Christopher L. Wooten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor wafer analysis system and method
Patent number
6,156,580
Issue date
Dec 5, 2000
Advanced Micro Devices, Inc.
Chris Wooten
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR IDENTIFYING BROKEN PINS IN A TEST SOCKET
Publication number
20110057666
Publication date
Mar 10, 2011
GLOBALFOUNDRIES INC.
Matthew S. Ryskoski
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR IDENTIFYING BROKEN PINS IN A TEST SOCKET
Publication number
20080258704
Publication date
Oct 23, 2008
Matthew S. Ryskoski
G01 - MEASURING TESTING
Information
Patent Application
Method for evaluating anomalies in a semiconductor manufacturing pr...
Publication number
20030072481
Publication date
Apr 17, 2003
Advanced Micro Devices, Inc.
Christopher L. Wooten
G06 - COMPUTING CALCULATING COUNTING