Christopher Liman

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for targeted monitoring of semiconductor measur...
- Patent number 12,019,030
- Issue date Jun 25, 2024
- KLA Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for combining x-ray metrology data sets to impr...
- Patent number 11,990,380
- Issue date May 21, 2024
- KLA Corporation
- Christopher Liman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods And Systems For Model-less, Scatterometry Based Measurement...
- Publication number 20240085321
- Publication date Mar 14, 2024
- KLA Corporation
- John Hench
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For X-Ray Scatterometry Measurements Employing...
- Publication number 20240060914
- Publication date Feb 22, 2024
- KLA Corporation
- Mohsen Mahvash
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Targeted Monitoring Of Semiconductor Measur...
- Publication number 20230228692
- Publication date Jul 20, 2023
- KLA Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Combining X-Ray Metrology Data Sets To Impr...
- Publication number 20200335406
- Publication date Oct 22, 2020
- KLA Corporation
- Christopher Liman
- H01 - BASIC ELECTRIC ELEMENTS