Christopher M. Smitchger

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Diagonal page mapping in memory systems
- Patent number 12,353,753
- Issue date Jul 8, 2025
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data integrity checks based on voltage distribution metrics
- Patent number 12,334,166
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Two-sided page scans with calibration feedback
- Patent number 12,040,025
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Christopher M. Smitchger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan fragmentation in memory devices
- Patent number 11,995,320
- Issue date May 28, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerating configuration updates for memory devices
- Patent number 11,984,174
- Issue date May 14, 2024
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G11 - INFORMATION STORAGE
Information Patent Grant
Optimized storage charge loss management
- Patent number 11,923,030
- Issue date Mar 5, 2024
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Grant
Data integrity checks based on voltage distribution metrics
- Patent number 11,810,631
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Determining threshold values for voltage distribution metrics
- Patent number 11,756,636
- Issue date Sep 12, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Open block management using storage charge loss margin checking
- Patent number 11,715,531
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Christopher M. Smitchger
- G11 - INFORMATION STORAGE
Information Patent Grant
Workload adaptive scans for memory sub-systems
- Patent number 11,715,541
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Renato C. Padilla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic program-verify voltage adjustment for intra-block storage c...
- Patent number 11,687,452
- Issue date Jun 27, 2023
- Micron Technology, Inc.
- Gary F. Besinga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagonal page mapping in memory systems
- Patent number 11,507,304
- Issue date Nov 22, 2022
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Initiating media management operation using voltage distribution me...
- Patent number 11,495,309
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Optimized storage charge loss management
- Patent number 11,456,051
- Issue date Sep 27, 2022
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Grant
Workload adaptive scans for memory sub-systems
- Patent number 11,393,548
- Issue date Jul 19, 2022
- Micron Technology, Inc.
- Renato C. Padilla
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
USE MODEL STATISTICS STORAGE IN A MEMORY SUBSYSTEM
- Publication number 20250130876
- Publication date Apr 24, 2025
- Micron Technology, Inc.
- Ryan G. Fisher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATING CONFIGURATION UPDATES FOR MEMORY DEVICES
- Publication number 20240257887
- Publication date Aug 1, 2024
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN FRAGMENTATION IN MEMORY DEVICES
- Publication number 20240256145
- Publication date Aug 1, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE INTEGRITY SCAN RATES IN A MEMORY SUB-SYSTEM BASED ON BLOCK...
- Publication number 20240062835
- Publication date Feb 22, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS
- Publication number 20240021258
- Publication date Jan 18, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
TWO-SIDED PAGE SCANS WITH CALIBRATION FEEDBACK
- Publication number 20230268009
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Christopher M. Smitchger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE PROFILE TRACKING FOR ADAPTIVE DATA INTEGRITY SCAN RATE...
- Publication number 20230229317
- Publication date Jul 20, 2023
- Micron Technology, Inc.
- Saeed Sharifi Tehrani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIAGONAL PAGE MAPPING IN MEMORY SYSTEMS
- Publication number 20230049877
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING THRESHOLD VALUES FOR VOLTAGE DISTRIBUTION METRICS
- Publication number 20220415412
- Publication date Dec 29, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
OPTIMIZED STORAGE CHARGE LOSS MANAGEMENT
- Publication number 20220392561
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGONAL PAGE MAPPING IN MEMORY SYSTEMS
- Publication number 20220391127
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN FRAGMENTATION IN MEMORY DEVICES
- Publication number 20220391102
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORKLOAD ADAPTIVE SCANS FOR MEMORY SUB-SYSTEMS
- Publication number 20220351796
- Publication date Nov 3, 2022
- Micron Technology, Inc.
- Renato C. Padilla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPEN BLOCK MANAGEMENT USING STORAGE CHARGE LOSS MARGIN CHECKING
- Publication number 20220310183
- Publication date Sep 29, 2022
- Micron Technology, Inc.
- Christopher M. Smitchger
- G11 - INFORMATION STORAGE
Information Patent Application
OPTIMIZED STORAGE CHARGE LOSS MANAGEMENT
- Publication number 20220310190
- Publication date Sep 29, 2022
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Application
ACCELERATING CONFIGURATION UPDATES FOR MEMORY DEVICES
- Publication number 20220284974
- Publication date Sep 8, 2022
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G11 - INFORMATION STORAGE
Information Patent Application
WORKLOAD ADAPTIVE SCANS FOR MEMORY SUB-SYSTEMS
- Publication number 20220199179
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Renato C. Padilla
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC PROGRAM-VERIFY VOLTAGE ADJUSTMENT FOR INTRA-BLOCK STORAGE C...
- Publication number 20220188226
- Publication date Jun 16, 2022
- Micron Technology, Inc.
- Gary F. Besinga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING THRESHOLD VALUES FOR VOLTAGE DISTRIBUTION METRICS IN ME...
- Publication number 20220189564
- Publication date Jun 16, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS
- Publication number 20220189572
- Publication date Jun 16, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE

Christopher M. Smitchger

Person

Patents Grantslast 30 patents

Diagonal page mapping in memory systems

Data integrity checks based on voltage distribution metrics

Two-sided page scans with calibration feedback

Scan fragmentation in memory devices

Accelerating configuration updates for memory devices

Optimized storage charge loss management

Data integrity checks based on voltage distribution metrics

Determining threshold values for voltage distribution metrics

Open block management using storage charge loss margin checking

Workload adaptive scans for memory sub-systems

Dynamic program-verify voltage adjustment for intra-block storage c...

Diagonal page mapping in memory systems

Initiating media management operation using voltage distribution me...

Optimized storage charge loss management

Workload adaptive scans for memory sub-systems

Patents Applicationslast 30 patents

USE MODEL STATISTICS STORAGE IN A MEMORY SUBSYSTEM

ACCELERATING CONFIGURATION UPDATES FOR MEMORY DEVICES

SCAN FRAGMENTATION IN MEMORY DEVICES

ADAPTIVE INTEGRITY SCAN RATES IN A MEMORY SUB-SYSTEM BASED ON BLOCK...

DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS

TWO-SIDED PAGE SCANS WITH CALIBRATION FEEDBACK

TEMPERATURE PROFILE TRACKING FOR ADAPTIVE DATA INTEGRITY SCAN RATE...

DIAGONAL PAGE MAPPING IN MEMORY SYSTEMS

DETERMINING THRESHOLD VALUES FOR VOLTAGE DISTRIBUTION METRICS

OPTIMIZED STORAGE CHARGE LOSS MANAGEMENT

DIAGONAL PAGE MAPPING IN MEMORY SYSTEMS

SCAN FRAGMENTATION IN MEMORY DEVICES

WORKLOAD ADAPTIVE SCANS FOR MEMORY SUB-SYSTEMS

OPEN BLOCK MANAGEMENT USING STORAGE CHARGE LOSS MARGIN CHECKING

OPTIMIZED STORAGE CHARGE LOSS MANAGEMENT

ACCELERATING CONFIGURATION UPDATES FOR MEMORY DEVICES

WORKLOAD ADAPTIVE SCANS FOR MEMORY SUB-SYSTEMS

DYNAMIC PROGRAM-VERIFY VOLTAGE ADJUSTMENT FOR INTRA-BLOCK STORAGE C...

DETERMINING THRESHOLD VALUES FOR VOLTAGE DISTRIBUTION METRICS IN ME...

DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS