Christopher McLaughlin

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Minneapolis, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for optimizing a lithography exposure process
- Patent number 11,531,279
- Issue date Dec 20, 2022
- Onto Innovation Inc.
- Elvino da Silveira
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Conformal stage
- Patent number 11,353,800
- Issue date Jun 7, 2022
- Onto Innovation Inc.
- J. Casey Donaher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for optimizing a lithography exposure process
- Patent number 11,126,096
- Issue date Sep 21, 2021
- Onto Innovation, Inc.
- Elvino Da Silveira
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Probe card analysis system and method
- Patent number 9,638,782
- Issue date May 2, 2017
- Rudolph Technologies, Inc.
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Grant
Probe card analysis system and method
- Patent number 8,466,703
- Issue date Jun 18, 2013
- Rudolph Technologies, Inc.
- Eric Endres
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR OPTIMIZING A LITHOGRAPHY EXPOSURE PROCESS
- Publication number 20220075282
- Publication date Mar 10, 2022
- Onto Innovation, Inc.
- Elvino da Silveira
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONFORMAL STAGE
- Publication number 20200401055
- Publication date Dec 24, 2020
- Onto Innovation, Inc.
- J. Casey DONAHER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR OPTIMIZING A LITHOGRAPHY EXPOSURE PROCESS
- Publication number 20200233320
- Publication date Jul 23, 2020
- Onto Innovation, Inc.
- Elvino DA SILVEIRA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROBE CARD ANALYSIS SYSTEM AND METHOD
- Publication number 20140021970
- Publication date Jan 23, 2014
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION OPTIMIZATION
- Publication number 20120189189
- Publication date Jul 26, 2012
- Rudolph Technologies Inc.
- Rodney Bryan Doe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD ANALYSIS SYSTEM AND METHOD
- Publication number 20110089965
- Publication date Apr 21, 2011
- Rudolph Technologies, Inc.
- Eric Endres
- G01 - MEASURING TESTING