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Christopher Morgan
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Portland, OR, US
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last 30 patents
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Patent Application
METHODS AND APPARATUS FOR FAULT ISOLATION WITH SCANNING ELECTRON MI...
Publication number
20250208208
Publication date
Jun 26, 2025
Intel Corporation
Joshua Kevek
G01 - MEASURING TESTING
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Patent Application
WAFER LEVEL ELECTRON BEAM PROBER
Publication number
20230305057
Publication date
Sep 28, 2023
Intel Corporation
Xianghong Tong
G01 - MEASURING TESTING