Christopher P. McAllister

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
JTAG boundary scan cell with enhanced testability feature
- Patent number 6,266,793
- Issue date Jul 24, 2001
- Intel Corporation
- Thomas J. Mozdzen
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement and compensation scheme
- Patent number 6,055,489
- Issue date Apr 25, 2000
- Intel Corporation
- Timothy S. Beatty
- G01 - MEASURING TESTING