TREA

Christopher Pan

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  • Portland, OR, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Phase jitter measurement circuit
    • Patent number 7,308,372
    • Issue date Dec 11, 2007
    • Intel Corporation
    • Michael C. Rifani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Delay element calibration
    • Patent number 7,024,324
    • Issue date Apr 4, 2006
    • Intel Corporation
    • Michael C. Rifani
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Phase jitter measurement circuit
    • Publication number 20060122806
    • Publication date Jun 8, 2006
    • Michael C. Rifani
    • G01 - MEASURING TESTING
  • Information Patent Application

    Delay element calibration
    • Publication number 20050278131
    • Publication date Dec 15, 2005
    • Michael C. Rifani
    • G01 - MEASURING TESTING