Christopher Richard Hamner

Person

Kirkland, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology system configured to illuminate and measure apertures of...
- Patent number 12,204,226
- Issue date Jan 21, 2025
- Mitutoyo Corporation
- Paul Gerard Gladnick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring probe with sensing coils and temperature compensation
- Patent number 12,174,013
- Issue date Dec 24, 2024
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 11,740,064
- Issue date Aug 29, 2023
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Modular configuration for coordinate measuring machine probe
- Patent number 11,733,021
- Issue date Aug 22, 2023
- Mitutoyo Corporation
- Dawn Alisa Keehnel
- G01 - MEASURING TESTING
Information Patent Grant
Shielding for sensor configuration and alignment of coordinate meas...
- Patent number 11,713,956
- Issue date Aug 1, 2023
- Mitutoyo Corporation
- Dawn Alisa Keehnel
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 11,644,298
- Issue date May 9, 2023
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position sensor signal gain control for coordinate measur...
- Patent number 11,644,299
- Issue date May 9, 2023
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 11,543,899
- Issue date Jan 3, 2023
- Mitutoyo Corporation
- Christopher Richard Hamner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 10,914,570
- Issue date Feb 9, 2021
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY SYSTEM CONFIGURED TO ILLUMINATE AND MEASURE APERTURES OF...
- Publication number 20240393657
- Publication date Nov 28, 2024
- MITUTOYO CORPORATION
- Paul Gerard GLADNICK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING PROBE WITH FIELD GENERATING COIL CONFIGURATION AND TEMPER...
- Publication number 20240219163
- Publication date Jul 4, 2024
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE WITH SENSING COILS AND TEMPERATURE COMPENSATION
- Publication number 20240219164
- Publication date Jul 4, 2024
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM FOR MEASURING EDGE OF CIRCULAR WORKPIECE
- Publication number 20240219316
- Publication date Jul 4, 2024
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING CONFIGURATION FOR METROLOGY SYSTEM WITH IMAGES ACQUIRED AT...
- Publication number 20230421909
- Publication date Dec 28, 2023
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHIELDING FOR SENSOR CONFIGURATION AND ALIGNMENT OF COORDINATE MEAS...
- Publication number 20230194233
- Publication date Jun 22, 2023
- MITUTOYO CORPORATION
- Dawn Alisa KEEHNEL
- G01 - MEASURING TESTING
Information Patent Application
MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE
- Publication number 20230194235
- Publication date Jun 22, 2023
- MITUTOYO CORPORATION
- Dawn Alisa KEEHNEL
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION SENSOR SIGNAL GAIN CONTROL FOR COORDINATE MEASUR...
- Publication number 20220205773
- Publication date Jun 30, 2022
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20220074728
- Publication date Mar 10, 2022
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20210116228
- Publication date Apr 22, 2021
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20210117020
- Publication date Apr 22, 2021
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20200141717
- Publication date May 7, 2020
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G01 - MEASURING TESTING

Christopher Richard Hamner

Person

Patents Grantslast 30 patents

Metrology system configured to illuminate and measure apertures of...

Measuring probe with sensing coils and temperature compensation

Inductive position detection configuration for indicating a measure...

Modular configuration for coordinate measuring machine probe

Shielding for sensor configuration and alignment of coordinate meas...

Inductive position detection configuration for indicating a measure...

Inductive position sensor signal gain control for coordinate measur...

Inductive position detection configuration for indicating a measure...

Inductive position detection configuration for indicating a measure...

Patents Applicationslast 30 patents

METROLOGY SYSTEM CONFIGURED TO ILLUMINATE AND MEASURE APERTURES OF...

MEASURING PROBE WITH FIELD GENERATING COIL CONFIGURATION AND TEMPER...

MEASURING PROBE WITH SENSING COILS AND TEMPERATURE COMPENSATION

METROLOGY SYSTEM FOR MEASURING EDGE OF CIRCULAR WORKPIECE

LIGHTING CONFIGURATION FOR METROLOGY SYSTEM WITH IMAGES ACQUIRED AT...

SHIELDING FOR SENSOR CONFIGURATION AND ALIGNMENT OF COORDINATE MEAS...

MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE

INDUCTIVE POSITION SENSOR SIGNAL GAIN CONTROL FOR COORDINATE MEASUR...

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...