Christopher S. Welch

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Gloucester, VA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optically stimulated electron emission contamination monitor and me...
- Patent number 6,856,403
- Issue date Feb 15, 2005
- The United States of America as represented by the administrator of the Natio...
- Christopher S. Welch
- G01 - MEASURING TESTING
Information Patent Grant
Quality monitor and monitoring technique employing optically stimul...
- Patent number 5,393,980
- Issue date Feb 28, 1995
- The United States of America as represented by the administrator of the Natio...
- William T. Yost
- G01 - MEASURING TESTING
Information Patent Grant
Method of remotely characterizing thermal properties of a sample
- Patent number 5,131,758
- Issue date Jul 21, 1992
- Administrator of the National Aeronautics and Space Administration
- Joseph S. Heyman
- G01 - MEASURING TESTING
Information Patent Grant
Thermal remote anemometer system
- Patent number 5,085,073
- Issue date Feb 4, 1992
- The United States of America as represented by the Administator of the United...
- Joseph S. Heyman
- G01 - MEASURING TESTING