Christopher Schantz

Person

  • Cambridge, MA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Non-intrusive monitoring

    • Patent number 9,945,692
    • Issue date Apr 17, 2018
    • Massachusetts Institute of Technology
    • Steven B. Leeb
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    NON-INTRUSIVE MONITORING

    • Publication number 20140320125
    • Publication date Oct 30, 2014
    • Steven B. Leeb
    • G01 - MEASURING TESTING