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Christopher SEIBERT
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Albuquerque, NM, US
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last 30 patents
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Patent Grant
Contactless optical probing of edge-coupled photonic ICs
Patent number
12,216,158
Issue date
Feb 4, 2025
Intel Corporation
Jeremy Hicks
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
CONTACTLESS OPTICAL PROBING OF EDGE-COUPLED PHOTONIC ICs
Publication number
20220163583
Publication date
May 26, 2022
Intel Corporation
Jeremy Hicks
G01 - MEASURING TESTING
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Patent Application
SYSTEMS AND METHODS FOR WAFER LEVEL BEAM PROFILE CHARACTERIZATION
Publication number
20220107472
Publication date
Apr 7, 2022
Intel Corporation
Alexander KRICHEVSKY
G02 - OPTICS