Christopher Storm

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Calibration chucks for optical probe systems, optical probe systems...
- Patent number 11,047,795
- Issue date Jun 29, 2021
- FormFactor, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems for testing a device under test
- Patent number 10,698,002
- Issue date Jun 30, 2020
- FormFactor Beaverton, Inc.
- Christopher Storm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shielded probe systems
- Patent number 10,060,950
- Issue date Aug 28, 2018
- FormFactor Beaverton, Inc.
- Michael E Simmons
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-handling end effectors with wafer-contacting surfaces and sea...
- Patent number 9,991,152
- Issue date Jun 5, 2018
- Cascade Microtech, Inc.
- Robbie Ingram-Goble
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Low noise connector with cables having a center, middle and outer c...
- Patent number 8,167,648
- Issue date May 1, 2012
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION CHUCKS FOR OPTICAL PROBE SYSTEMS, OPTICAL PROBE SYSTEMS...
- Publication number 20200378888
- Publication date Dec 3, 2020
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST
- Publication number 20190101567
- Publication date Apr 4, 2019
- FormFactor Beaverton, Inc.
- Christopher Storm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHIELDED PROBE SYSTEMS
- Publication number 20170205446
- Publication date Jul 20, 2017
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
WAFER-HANDLING END EFFECTORS
- Publication number 20150255322
- Publication date Sep 10, 2015
- Cascade Microtech, Inc.
- Robbie Ingram-Goble
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
PROBE STATION WITH IMPROVED INTERCONNECTION
- Publication number 20110207370
- Publication date Aug 25, 2011
- Kazuki Negishi
- G01 - MEASURING TESTING