Christopher T. McEvoy

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Burlington, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Determining intra-die variation of an integrated circuit
- Patent number 9,255,962
- Issue date Feb 9, 2016
- GLOBALFOUNDRIES, INC.
- Jeanne P. S. Bickford
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING INTRA-DIE VARIATION OF AN INTEGRATED CIRCUIT
- Publication number 20150048860
- Publication date Feb 19, 2015
- International Business Machines Corporation
- Jeanne P.S. Bickford
- G01 - MEASURING TESTING