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Christopher W. Blaufus
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San Jose, CA, US
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last 30 patents
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Patent Grant
Transferring, buffering and measuring a substrate in a metrology sy...
Patent number
7,301,623
Issue date
Nov 27, 2007
Nanometrics Incorporated
Jonathan M. Madsen
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Edge grip chuck
Patent number
7,032,287
Issue date
Apr 25, 2006
Nanometrics Incorporated
Blaine R. Spady
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Precision polar coordinate stage
Patent number
6,910,847
Issue date
Jun 28, 2005
Nanometrics Incorporated
Christopher W. Blaufus
H01 - BASIC ELECTRIC ELEMENTS