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Christopher W. Schuermyer
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Happy Valley, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Predicting no-defect-found physical failure analysis results using...
Patent number
10,769,347
Issue date
Sep 8, 2020
Synopsys, Inc.
Christopher W. Schuermyer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Generating root cause candidates for yield analysis
Patent number
10,496,779
Issue date
Dec 3, 2019
Mentor Graphics Corporation
Robert Brady Benware
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Identifying failure mechanisms based on a population of scan diagno...
Patent number
9,703,658
Issue date
Jul 11, 2017
Synopsys, Inc.
Christopher W. Schuermyer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Generating root cause candidates for yield analysis
Patent number
9,443,051
Issue date
Sep 13, 2016
Mentor Graphics Corporation
Robert Brady Benware
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hybrid memory failure bitmap classification
Patent number
9,135,103
Issue date
Sep 15, 2015
Mentor Graphics Corporation
Yu Huang
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
GENERATING ROOT CAUSE CANDIDATES FOR YIELD ANALYSIS
Publication number
20170103158
Publication date
Apr 13, 2017
Mentor Graphics Corporation
Robert Brady Benware
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IDENTIFYING FAILURE MECHANISMS BASED ON A POPULATION OF SCAN DIAGNO...
Publication number
20170052861
Publication date
Feb 23, 2017
Synopsys, Inc.
Christopher W. Schuermyer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Generating Root Cause Candidates For Yield Analysis
Publication number
20140059511
Publication date
Feb 27, 2014
Mentor Graphics Corporation
Robert Brady Benware
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Hybrid Memory Failure Bitmap Classification
Publication number
20130219216
Publication date
Aug 22, 2013
Mentor Graphics Corporation
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Cell-Aware Fault Model Creation And Pattern Generation
Publication number
20100229061
Publication date
Sep 9, 2010
Friedrich HAPKE
G01 - MEASURING TESTING