Christos MESSINIS

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Amsterdam, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining a characteristic of a structure, and metrolog...
- Patent number 11,119,415
- Issue date Sep 14, 2021
- ASML Netherlands B.V.
- Johannes Fitzgerald De Boer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A METHOD FOR DETERMINING A VERTICAL POSITION OF A STRUCTURE ON A SU...
- Publication number 20250208520
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Arie Jeffrey DEN BOEF
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION ARRANGEMENT FOR A METROLOGY DEVICE AND ASSOCIATED METHOD
- Publication number 20250207978
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Theodorus Thomas Marinus VAN SCHAIJK
- G01 - MEASURING TESTING
Information Patent Application
DARK FIELD DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY...
- Publication number 20230044632
- Publication date Feb 9, 2023
- ASML NETHERLANDS B.V.
- Willem Marie Julia Marcel COENE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Determining a Characteristic of a Structure, and Metrolog...
- Publication number 20210349403
- Publication date Nov 11, 2021
- ASML NETHERLANDS B.V.
- Johannes Fitzgerald De Boer
- G01 - MEASURING TESTING
Information Patent Application
Method of Determining a Characteristic of a Structure, and Metrolog...
- Publication number 20190310559
- Publication date Oct 10, 2019
- Stichting VU
- Johannes Fitzgerald DE BOER
- G01 - MEASURING TESTING