Chrysostomos BATISTAKIS

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method for predicting resist deformation
- Patent number 11,914,942
- Issue date Feb 27, 2024
- ASML Netherlands B.V.
- Chrysostomos Batistakis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for predicting layer deformation
- Patent number 11,880,640
- Issue date Jan 23, 2024
- ASML Netherlands B.V.
- Chrysostomos Batistakis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for predicting resist deformation
- Patent number 11,709,988
- Issue date Jul 25, 2023
- ASML Netherlands B.V.
- Chrysostomos Batistakis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for predicting layer deformation
- Patent number 11,625,520
- Issue date Apr 11, 2023
- ASML Netherlands B.V.
- Chrysostomos Batistakis
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...
- Publication number 20240369944
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA-DRIVEN PREDICTION AND IDENTIFICATION OF FAILURE MODES BASED ON...
- Publication number 20240062356
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Huina XU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...
- Publication number 20240054669
- Publication date Feb 15, 2024
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED IMAGE GENERATION OF AFTER-DEVELOPMENT OR AFT...
- Publication number 20240020961
- Publication date Jan 18, 2024
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PREDICTING RESIST DEFORMATION
- Publication number 20230334217
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION
- Publication number 20230222273
- Publication date Jul 13, 2023
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PREDICTING STOCHASTIC CONTRIBUTORS
- Publication number 20230081821
- Publication date Mar 16, 2023
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPEC...
- Publication number 20220375063
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PREDICTING RESIST DEFORMATION
- Publication number 20220075275
- Publication date Mar 10, 2022
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION
- Publication number 20200320238
- Publication date Oct 8, 2020
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING

Chrysostomos BATISTAKIS

Person

Patents Grantslast 30 patents

Method for predicting resist deformation

Systems and methods for predicting layer deformation

Method for predicting resist deformation

Systems and methods for predicting layer deformation

Patents Applicationslast 30 patents

METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...

DATA-DRIVEN PREDICTION AND IDENTIFICATION OF FAILURE MODES BASED ON...

APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...

MACHINE LEARNING BASED IMAGE GENERATION OF AFTER-DEVELOPMENT OR AFT...

METHOD FOR PREDICTING RESIST DEFORMATION

SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION

METHOD FOR PREDICTING STOCHASTIC CONTRIBUTORS

SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPEC...

METHOD FOR PREDICTING RESIST DEFORMATION

SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION