Chu-shik Kang

Person

Daejeon, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Thickness measuring apparatus and thickness measuring method
- Patent number 9,921,051
- Issue date Mar 20, 2018
- Korea Research Institute of Standards and Science
- Jae-Wan Kim
- G01 - MEASURING TESTING
Information Patent Grant
Absolute position measurement method, absolute position measurement...
- Patent number 9,651,403
- Issue date May 16, 2017
- Korea Research Institute of Standards and Science
- Jong-Ahn Kim
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring via hole of silicon wafer
- Patent number 9,121,696
- Issue date Sep 1, 2015
- Korea Research Institute of Standards and Science
- Jong Han Jin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for stabilizing frequency of laser
- Patent number 8,290,007
- Issue date Oct 16, 2012
- Korea Research Institute of Standards and Science
- Jae-Wan Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shape measurement apparatus and method
- Patent number 8,279,448
- Issue date Oct 2, 2012
- Korea Research Institute of Standards and Science
- Jae-wan Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ABSOLUTE POSITION MEASUREMENT METHOD, ABSOLUTE POSITION MEASUREMENT...
- Publication number 20150069225
- Publication date Mar 12, 2015
- Korea Research Institute of Standards and Science
- Jong-Ahn KIM
- G01 - MEASURING TESTING
Information Patent Application
TRANSPARENT SUBSTRATE MONITORING APPARATUS AND TRANSPARENT SUBSTRAT...
- Publication number 20150009509
- Publication date Jan 8, 2015
- Korea Research Institute of Standards and Science
- Jae-Wan KIM
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS MEASURING APPARATUS AND THICKNESS MEASURING METHOD
- Publication number 20150012246
- Publication date Jan 8, 2015
- Korea Research Institute of Standards and Science
- Jae-Wan KIM
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING VIA HOLE OF SILICON WAFER
- Publication number 20130206992
- Publication date Aug 15, 2013
- Korea Research Institute of Standards and Science
- Jong Han Jin
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT APPARATUS AND METHOD
- Publication number 20100182614
- Publication date Jul 22, 2010
- Korea Research Institute of Standards and Science
- Jae-wan Kim
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR STABILIZING FREQUENCY OF LASER
- Publication number 20100177795
- Publication date Jul 15, 2010
- Korea Research Institute of Standards and Science
- Jae-Wan Kim
- H01 - BASIC ELECTRIC ELEMENTS

Chu-shik Kang

Person

Patents Grantslast 30 patents

Thickness measuring apparatus and thickness measuring method

Absolute position measurement method, absolute position measurement...

Device and method for measuring via hole of silicon wafer

Apparatus and method for stabilizing frequency of laser

Shape measurement apparatus and method

Patents Applicationslast 30 patents

ABSOLUTE POSITION MEASUREMENT METHOD, ABSOLUTE POSITION MEASUREMENT...

TRANSPARENT SUBSTRATE MONITORING APPARATUS AND TRANSPARENT SUBSTRAT...

THICKNESS MEASURING APPARATUS AND THICKNESS MEASURING METHOD

DEVICE AND METHOD FOR MEASURING VIA HOLE OF SILICON WAFER

SHAPE MEASUREMENT APPARATUS AND METHOD

APPARATUS AND METHOD FOR STABILIZING FREQUENCY OF LASER