Chuan-Hsiang SUN

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Taoyuan City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for probing device-under-test
- Patent number 12,345,760
- Issue date Jul 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming probe head structure
- Patent number 12,019,097
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for probing device-under-test
- Patent number 11,821,942
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD STRUCTURE
- Publication number 20240302410
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Yi LIN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR PROBING DEVICE-UNDER-TEST
- Publication number 20240012046
- Publication date Jan 11, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20230065443
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Yi LIN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROBING DEVICE-UNDER-TEST
- Publication number 20230068552
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING