Chuan Hua Chiu

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Hsinchu, TW

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Patents Grantslast 30 patents

Information Patent Grant
System and method for monitoring wafer furnace production efficiency
- Patent number 7,151,975
- Issue date Dec 19, 2006
- Macronix International Co., Ltd.
- Topas Chang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for monitoring wafer furnace production efficiency
- Publication number 20050177263
- Publication date Aug 11, 2005
- MACRONIX INTERNATIONAL CO., LTD
- Topas Chang
- G06 - COMPUTING CALCULATING COUNTING