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Shanghai, CN
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last 30 patents
Information
Patent Grant
Ion trap with parallel bar-electrode arrays
Patent number
9,735,001
Issue date
Aug 15, 2017
FUDAN UNIVERSITY
Chuanfan Ding
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for tandem mass spectrometry analysis in ion trap mass analyzer
Patent number
9,640,377
Issue date
May 2, 2017
FUDAN UNIVERSITY
Fuxing Xu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap with parallel bar-electrode arrays
Patent number
9,111,741
Issue date
Aug 18, 2015
Fudan University
Chuanfan Ding
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap, multiple electrode system and electrode for mass spectrom...
Patent number
8,395,114
Issue date
Mar 12, 2013
Xiang Fang
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ION EXCITATION METHOD IN LINEAR ION TRAP
Publication number
20190013194
Publication date
Jan 10, 2019
Fudan University
Qiankun DANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR TANDEM MASS SPECTROMETRY ANALYSIS IN ION TRAP MASS ANALYZER
Publication number
20160365231
Publication date
Dec 15, 2016
Fudan University
Fuxing XU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION TRAP ARRAY
Publication number
20160049287
Publication date
Feb 18, 2016
Fudan University
Chuanfan DING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion trap, multiple electrode system and electrode for mass spectrom...
Publication number
20090321624
Publication date
Dec 31, 2009
Xiang Fang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION TRAP ARRAY
Publication number
20090294655
Publication date
Dec 3, 2009
Chuanfan Ding
H01 - BASIC ELECTRIC ELEMENTS