Chuanyong Huang

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Minimizing filed size to reduce unwanted stray light
- Patent number 10,739,276
- Issue date Aug 11, 2020
- KLA-Tencor Corporation
- Donald Pettibone
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection with large particle monitoring and laser...
- Patent number 10,324,045
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Steve (Yifeng) Cui
- G01 - MEASURING TESTING
Information Patent Grant
Haze and defect distribution and aperture configuration in surface...
- Patent number 10,088,345
- Issue date Oct 2, 2018
- KLA-Tencor Corporation
- Chuanyong Huang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for luminescent tag based wafer inspection
- Patent number 9,970,873
- Issue date May 15, 2018
- KLA-Tencor Corporation
- Donald Pettibone
- G01 - MEASURING TESTING
Information Patent Grant
System and method for simultaneous dark field and phase contrast in...
- Patent number 9,726,615
- Issue date Aug 8, 2017
- KLA-Tencor Corporation
- Chuanyong Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING DIFFERENTIAL INTERFERENCE CONTRAST IN AN IMAGING SYSTEM DE...
- Publication number 20200132608
- Publication date Apr 30, 2020
- KLA Corporation
- Raymond Chu
- G02 - OPTICS
Information Patent Application
Minimizing Field Size to Reduce Unwanted Stray Light
- Publication number 20190137411
- Publication date May 9, 2019
- KLA-Tencor Corporation
- Donald Pettibone
- G01 - MEASURING TESTING
Information Patent Application
Surface Defect Inspection With Large Particle Monitoring And Laser...
- Publication number 20180038803
- Publication date Feb 8, 2018
- KLA-Tencor Corporation
- Steve (Yifeng) Cui
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Simultaneous Dark Field and Phase Contrast In...
- Publication number 20160025645
- Publication date Jan 28, 2016
- KLA-Tencor Corporation
- Chuanyong Huang
- G01 - MEASURING TESTING