Chul Ho Ham

Person

Yongi, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Transfer device of handler for testing semiconductor device
- Patent number 7,464,807
- Issue date Dec 16, 2008
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Socket assembly for testing semiconductor device
- Patent number 7,429,868
- Issue date Sep 30, 2008
- Mirae Corporation
- Chan Ho Park
- G01 - MEASURING TESTING
Information Patent Grant
Handler for testing semiconductor devices
- Patent number 7,408,338
- Issue date Aug 5, 2008
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Test tray for handler for testing semiconductor devices
- Patent number 7,253,653
- Issue date Aug 7, 2007
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Handler for testing semiconductor devices
- Patent number 7,196,508
- Issue date Mar 27, 2007
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Test tray with carrier modules for a semiconductor device handler
- Patent number 7,135,703
- Issue date Nov 14, 2006
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Carrier module
- Patent number 7,061,101
- Issue date Jun 13, 2006
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Methods for compensating for a test temperature deviation
- Patent number 7,008,804
- Issue date Mar 7, 2006
- Mirae Corporation
- Jae Myeong Song
- G01 - MEASURING TESTING
Information Patent Grant
Carrier module for semiconductor device test handler
- Patent number 6,873,169
- Issue date Mar 29, 2005
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Device for compensating for a test temperature deviation in a semic...
- Patent number 6,861,861
- Issue date Mar 1, 2005
- LG Electronics Inc.
- Jae Myeong Song
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Handler for testing semiconductor devices
- Publication number 20070152655
- Publication date Jul 5, 2007
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Handler for testing semiconductor devices
- Publication number 20060214655
- Publication date Sep 28, 2006
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Test tray for handler for testing semiconductor devices
- Publication number 20060192583
- Publication date Aug 31, 2006
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Sokcet assembly for testing semiconductor device
- Publication number 20060170412
- Publication date Aug 3, 2006
- MIRAE CORPORATION
- Chan Ho Park
- G01 - MEASURING TESTING
Information Patent Application
Transfer device of handler for testing semiconductor device
- Publication number 20060119345
- Publication date Jun 8, 2006
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Carrier module
- Publication number 20050200000
- Publication date Sep 15, 2005
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Test tray with carrier modules for a semiconductor device handler
- Publication number 20040016993
- Publication date Jan 29, 2004
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Methods for compensating for a test temperature deviation
- Publication number 20040019452
- Publication date Jan 29, 2004
- MIRAE CORPORATION
- Jae Myeong Song
- G01 - MEASURING TESTING
Information Patent Application
Device for compensating for a test temperature deviation in a semic...
- Publication number 20040017185
- Publication date Jan 29, 2004
- MIRAE CORPORATION
- Jae Myeong Song
- G01 - MEASURING TESTING

Chul Ho Ham

Person

Patents Grantslast 30 patents

Transfer device of handler for testing semiconductor device

Socket assembly for testing semiconductor device

Handler for testing semiconductor devices

Test tray for handler for testing semiconductor devices

Handler for testing semiconductor devices

Test tray with carrier modules for a semiconductor device handler

Carrier module

Methods for compensating for a test temperature deviation

Carrier module for semiconductor device test handler

Device for compensating for a test temperature deviation in a semic...

Patents Applicationslast 30 patents

Handler for testing semiconductor devices

Handler for testing semiconductor devices

Test tray for handler for testing semiconductor devices

Sokcet assembly for testing semiconductor device

Transfer device of handler for testing semiconductor device

Carrier module

Test tray with carrier modules for a semiconductor device handler

Methods for compensating for a test temperature deviation

Device for compensating for a test temperature deviation in a semic...