Springfield, VA, US
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The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G02 - OPTICS
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The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G02 - OPTICS
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The Governement of the United States of America, as represented by the Secret...
Jerry R. Meyer
G01 - MEASURING TESTING
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The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G02 - OPTICS
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The United States of America, as represented by the Secretary of the Navy
Jerry R. Meyer
G02 - OPTICS
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The United States of America, as represented by the Secretary of the Navy
Jerry R. Meyer
G02 - OPTICS
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The United States of America, as represented by the Secretary of the Navy
Jerry R. Meyer
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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The United States of America, as represented by the Secretary of the Navy
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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The United States of America, as represented by the Secretary of the Navy
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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BAYSTATE MEDICAL CENTER, INC.
Nagendra Yadava
C07 - ORGANIC CHEMISTRY
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BAYSTATE MEDICAL CENTER, INC.
Nagendra Yadava
C07 - ORGANIC CHEMISTRY
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The United States of America, as represented by the Secretary of the Navy
Igor Vurgaftman
H01 - BASIC ELECTRIC ELEMENTS
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The United States of America, as represented by the Secretary of the Navy
Chul Soo Kim
H01 - BASIC ELECTRIC ELEMENTS
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The United States of America, as represented by the Secretary of the Navy
Igor Vurgaftman
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Igor Vurgaftman
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Igor Vurgaftman
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Igor Vurgaftman
B82 - NANO-TECHNOLOGY
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Joseph D LaVeigne
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G02 - OPTICS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
G02 - OPTICS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Jerry R. Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Baystate Medical Center, Inc.
Nagendra Yadava
G01 - MEASURING TESTING
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Patent Application
University of Massachusetts
Nagendra Yadava
G01 - MEASURING TESTING
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Patent Application
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETA...
Igor Vurgaftman
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETA...
Chul Soo Kim
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
University of Massachusetts
Nagendra Yadava
G01 - MEASURING TESTING
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Patent Application
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETA...
Igor Vurgaftman
B82 - NANO-TECHNOLOGY
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Patent Application
University of Massachusetts
Nagendra Yadava
G01 - MEASURING TESTING
