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Chul-woong Jang
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Cheonan-si, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Signal capture system and test apparatus including the same
Patent number
8,476,908
Issue date
Jul 2, 2013
Samsung Electronics Co., Ltd.
Woon-sup Choi
G11 - INFORMATION STORAGE
Information
Patent Grant
Field mounting-type test apparatus and method for testing memory co...
Patent number
8,103,927
Issue date
Jan 24, 2012
Samsung Electronics Co., Ltd.
In-ho Choi
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for testing a semiconductor package
Patent number
7,816,937
Issue date
Oct 19, 2010
Samsung Electronics Co., Ltd.
Young-Ki Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Automatic test equipment capable of high speed test
Patent number
7,772,828
Issue date
Aug 10, 2010
Samsung Electronics Co., Ltd.
Chul-woong Jang
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME
Publication number
20110109318
Publication date
May 12, 2011
Samsung Electronics Co., Ltd.
Woon-sup Choi
G11 - INFORMATION STORAGE
Information
Patent Application
Field mounting-type test apparatus and method for testing memory co...
Publication number
20090300442
Publication date
Dec 3, 2009
Samsung Electronics Co.
In-ho Choi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR TESTING AN OBJECT
Publication number
20090015287
Publication date
Jan 15, 2009
YOUNG-KI KWAK
G01 - MEASURING TESTING
Information
Patent Application
Automatic test equipment capable of high speed test
Publication number
20080204066
Publication date
Aug 28, 2008
Samsung Electronics Co., Ltd.
Chul-wuong Jang
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor testing apparatus and method of calibrating the same
Publication number
20070101219
Publication date
May 3, 2007
Seung-Ho Jang
G01 - MEASURING TESTING
Information
Patent Application
Calibration jig and calibration apparatus having the same
Publication number
20070085551
Publication date
Apr 19, 2007
Seung-Ho Jang
G01 - MEASURING TESTING