Chun-Sheng Wang

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Jhubei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Capacitance sensing device operation method
- Patent number 11,811,398
- Issue date Nov 7, 2023
- Sensortek Technology Corp.
- Wang-An Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of wafer height mapping
- Patent number 6,975,407
- Issue date Dec 13, 2005
- Taiwan Semiconductor Manufacturing Co, Ltd.
- Chun-Sheng Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CAPACITANCE SENSING DEVICE OPERATION METHOD
- Publication number 20220057540
- Publication date Feb 24, 2022
- SENSORTEK TECHNOLOGY CORP.
- WANG-AN LIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF WAFER HEIGHT MAPPING
- Publication number 20050259272
- Publication date Nov 24, 2005
- Chun-Sheng Wang
- G01 - MEASURING TESTING
Information Patent Application
Wafer aligner with WEE (water edge exposure) function
- Publication number 20050248754
- Publication date Nov 10, 2005
- Chun-Sheng Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY