CHUNG-HAO HU

Person

HSINCHU CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for monitoring edge bevel removal area in semi...
- Patent number 12,169,179
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao-Tung Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring edge bevel removal area in semi...
- Patent number 11,781,995
- Issue date Oct 10, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao-Tung Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for automatic concentration control
- Patent number 11,687,102
- Issue date Jun 27, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Lun Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods for automatic concentration control
- Patent number 11,586,230
- Issue date Feb 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Hao Kuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring edge bevel removal area in semi...
- Patent number 11,268,913
- Issue date Mar 8, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao-Tung Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring edge bevel removal area in semi...
- Patent number 10,648,927
- Issue date May 12, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao-Tung Wu
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MONITORING EDGE BEVEL REMOVAL AREA IN SEMI...
- Publication number 20230375482
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO-TUNG WU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATIC CONCENTRATION CONTROL
- Publication number 20220365546
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Lun CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MONITORING EDGE BEVEL REMOVAL AREA IN SEMI...
- Publication number 20220187216
- Publication date Jun 16, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO-TUNG WU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATIC CONCENTRATION CONTROL
- Publication number 20210200250
- Publication date Jul 1, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Hao KUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MONITORING EDGE BEVEL REMOVAL AREA IN SEMI...
- Publication number 20200264112
- Publication date Aug 20, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO-TUNG WU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MONITORING EDGE BEVEL REMOVAL AREA IN SEMI...
- Publication number 20160337621
- Publication date Nov 17, 2016
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO-TUNG WU
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

CHUNG-HAO HU

Person

Patents Grantslast 30 patents

Method and apparatus for monitoring edge bevel removal area in semi...

Method and apparatus for monitoring edge bevel removal area in semi...

Systems and methods for automatic concentration control

Systems and methods for automatic concentration control

Method and apparatus for monitoring edge bevel removal area in semi...

Method and apparatus for monitoring edge bevel removal area in semi...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MONITORING EDGE BEVEL REMOVAL AREA IN SEMI...

SYSTEMS AND METHODS FOR AUTOMATIC CONCENTRATION CONTROL

METHOD AND APPARATUS FOR MONITORING EDGE BEVEL REMOVAL AREA IN SEMI...

SYSTEMS AND METHODS FOR AUTOMATIC CONCENTRATION CONTROL

METHOD AND APPARATUS FOR MONITORING EDGE BEVEL REMOVAL AREA IN SEMI...

METHOD AND APPARATUS FOR MONITORING EDGE BEVEL REMOVAL AREA IN SEMI...