Chungsam Jun

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through-focus image-based metrology device, operation method thereo...
- Patent number 11,988,495
- Issue date May 21, 2024
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus for inspecting semiconductor devices using cha...
- Patent number 11,754,517
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Suyoung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 11,754,510
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor wafer, an inspection system for...
- Patent number 10,269,111
- Issue date Apr 23, 2019
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring thickness
- Patent number 10,088,297
- Issue date Oct 2, 2018
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Fan-out panel level package and method of fabricating the same
- Patent number 9,892,980
- Issue date Feb 13, 2018
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ellipsometer and method of inspecting pattern asymmetry using the same
- Patent number 9,719,946
- Issue date Aug 1, 2017
- Samsung Electronics Co., Ltd.
- Choonshik Leem
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ellipsometer and method of inspecting pattern asymmetry using the same
- Patent number 9,612,212
- Issue date Apr 4, 2017
- Samsung Electronics Co., Ltd.
- Choonshik Leem
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device using semiconductor...
- Patent number 9,583,402
- Issue date Feb 28, 2017
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor device and method of fabricating...
- Patent number 9,466,537
- Issue date Oct 11, 2016
- Samsung Electronics Co., Ltd.
- Minkook Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection system and methods of inspecting a semicon...
- Patent number 9,455,121
- Issue date Sep 27, 2016
- Samsung Electronics Co., Ltd.
- Hyunwoo Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240175915
- Publication date May 30, 2024
- Samsung Electronics Co., Ltd.
- SEKYE JEON
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION METHOD
- Publication number 20240019380
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Kihong Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...
- Publication number 20230384239
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Doyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20230266258
- Publication date Aug 24, 2023
- Samsung Electronics Co., Ltd.
- INHYE PARK
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR INSPECTION MET...
- Publication number 20230197402
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- YUJIN CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...
- Publication number 20230123710
- Publication date Apr 20, 2023
- Samsung Electronics Co., Ltd.
- Doyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...
- Publication number 20210396510
- Publication date Dec 23, 2021
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICES USING CHA...
- Publication number 20210333225
- Publication date Oct 28, 2021
- Samsung Electronics Co., Ltd.
- Suyoung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME
- Publication number 20180096903
- Publication date Apr 5, 2018
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR...
- Publication number 20180053292
- Publication date Feb 22, 2018
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THICKNESS
- Publication number 20170363418
- Publication date Dec 21, 2017
- Samsung Electronics Co., Ltd.
- Sung Yoon RYU
- G01 - MEASURING TESTING
Information Patent Application
FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME
- Publication number 20170309523
- Publication date Oct 26, 2017
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...
- Publication number 20170200658
- Publication date Jul 13, 2017
- Samsung Electronics Co., Ltd.
- Yusin Yang
- G01 - MEASURING TESTING
Information Patent Application
ELLIPSOMETER AND METHOD OF INSPECTING PATTERN ASYMMETRY USING THE SAME
- Publication number 20170176348
- Publication date Jun 22, 2017
- Samsung Electronics Co., Ltd.
- Choonshik LEEM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING...
- Publication number 20160204041
- Publication date Jul 14, 2016
- Samsung Electronics Co., Ltd.
- Minkook KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...
- Publication number 20160086769
- Publication date Mar 24, 2016
- Hyunwoo KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING SEMICONDUCTOR...
- Publication number 20160027707
- Publication date Jan 28, 2016
- Samsung Electronics Co., Ltd.
- Sung Yoon RYU
- H01 - BASIC ELECTRIC ELEMENTS

Chungsam Jun

Person

Patents Grantslast 30 patents

Inspection system of semiconductor wafer and method of driving the...

Through-focus image-based metrology device, operation method thereo...

Inspection apparatus for inspecting semiconductor devices using cha...

Inspection system of semiconductor wafer and method of driving the...

Method of inspecting semiconductor wafer, an inspection system for...

Apparatus and method for measuring thickness

Fan-out panel level package and method of fabricating the same

Ellipsometer and method of inspecting pattern asymmetry using the same

Ellipsometer and method of inspecting pattern asymmetry using the same

Method of manufacturing a semiconductor device using semiconductor...

Method of inspecting semiconductor device and method of fabricating...

Semiconductor inspection system and methods of inspecting a semicon...

Patents Applicationslast 30 patents

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

SUBSTRATE INSPECTION METHOD

INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...

METHOD OF INSPECTING SEMICONDUCTOR DEVICE

SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR INSPECTION MET...

INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...

THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...

INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICES USING CHA...

FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME

METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR...

APPARATUS AND METHOD FOR MEASURING THICKNESS

FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME

METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...

ELLIPSOMETER AND METHOD OF INSPECTING PATTERN ASYMMETRY USING THE SAME

METHOD OF INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING...

SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING SEMICONDUCTOR...