Chunho Kim

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Duluth, GA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection system
- Patent number 7,308,367
- Issue date Dec 11, 2007
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,103,482
- Issue date Sep 5, 2006
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM AND APPARATUS
- Publication number 20050059174
- Publication date Mar 17, 2005
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system
- Publication number 20040241890
- Publication date Dec 2, 2004
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING