Chuong T. Huynh

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Quincy, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam system and methods
- Patent number 10,410,828
- Issue date Sep 10, 2019
- Carl Zeiss Microscopy, LLC
- Chuong Huynh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dummy copper deprocessing
- Patent number 6,863,787
- Issue date Mar 8, 2005
- FEI Company
- Chuong T. Huynh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
WAFER-TILT DETERMINATION FOR SLICE-AND-IMAGE PROCESS
- Publication number 20230115376
- Publication date Apr 13, 2023
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF CROSS-SECTION IMAGING OF AN INSPECTION VOLUME IN A WAFER
- Publication number 20220392793
- Publication date Dec 8, 2022
- Carl Zeiss SMT GMBH
- Alex Buxbaum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHODS
- Publication number 20190189392
- Publication date Jun 20, 2019
- Carl Zeiss Microscopy, LLC
- Chuong Huynh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHODS
- Publication number 20160203948
- Publication date Jul 14, 2016
- Carl Zeiss Microscopy, LLC
- Chuong Huynh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dummy copper deprocessing
- Publication number 20040203249
- Publication date Oct 14, 2004
- Chuong T. Huynh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...