Chusuke Munakata

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Process for preparing protein-oriented membrane
- Patent number 5,252,719
- Issue date Oct 12, 1993
- Hitachi, Ltd.
- Kazuo Takeda
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Method of semiconductor surface measurment and an apparatus for rea...
- Patent number 5,140,272
- Issue date Aug 18, 1992
- Hitachi, Ltd.
- Shigeru Nishimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring particles in liquid
- Patent number 4,876,458
- Issue date Oct 24, 1989
- Hitachi, Ltd.
- Kazuo Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Monitor for particles of various materials
- Patent number 4,827,143
- Issue date May 2, 1989
- Hitachi, Ltd.
- Chusuke Munakata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning photon microscope for simulataneously displaying both the...
- Patent number 4,791,288
- Issue date Dec 13, 1988
- Hitachi, Ltd.
- Kanji Kinameri
- G02 - OPTICS
Information Patent Grant
Apparatus for and method of measuring boundary surface
- Patent number 4,767,211
- Issue date Aug 30, 1988
- Hitachi, Ltd.
- Chusuke Munakata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning laser microscope with aperture alignment
- Patent number 4,733,063
- Issue date Mar 22, 1988
- Hitachi, Ltd.
- Shigeharu Kimura
- G02 - OPTICS
Information Patent Grant
Pattern defect inspection apparatus
- Patent number 4,731,855
- Issue date Mar 15, 1988
- Hitachi, Ltd.
- Kyo Suda
- G01 - MEASURING TESTING
Information Patent Grant
Method of information recording on a semiconductor wafer
- Patent number 4,672,578
- Issue date Jun 9, 1987
- Hitachi, Ltd.
- Chusuke Munakata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for measuring carrier lifetimes of a semiconductor wafer
- Patent number 4,581,578
- Issue date Apr 8, 1986
- Hitachi, Ltd.
- Noriaki Honma
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for nondestructively measuring characteristics of a semic...
- Patent number 4,563,642
- Issue date Jan 7, 1986
- Hitachi, Ltd.
- Chusuke Munakata
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring semiconductor characteristics
- Patent number 4,464,627
- Issue date Aug 7, 1984
- Hitachi, Ltd.
- Chusuke Munakata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning-image forming apparatus using photo response signal
- Patent number 4,453,181
- Issue date Jun 5, 1984
- Hitachi, Ltd.
- Chusuke Munakata
- G01 - MEASURING TESTING

Chusuke Munakata

Person

Patents Grantslast 30 patents

Process for preparing protein-oriented membrane

Method of semiconductor surface measurment and an apparatus for rea...

Apparatus for measuring particles in liquid

Monitor for particles of various materials

Scanning photon microscope for simulataneously displaying both the...

Apparatus for and method of measuring boundary surface

Scanning laser microscope with aperture alignment

Pattern defect inspection apparatus

Method of information recording on a semiconductor wafer

Apparatus for measuring carrier lifetimes of a semiconductor wafer

Apparatus for nondestructively measuring characteristics of a semic...

Device for measuring semiconductor characteristics

Scanning-image forming apparatus using photo response signal