TREA

Chwen-Jiann Fang

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  • Palo Alto, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Detecting defects on a wafer
    • Patent number 9,355,208
    • Issue date May 31, 2016
    • KLA-Tencor Corp.
    • Eugene Shifrin
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents