Chwen Yu

Person

Taipei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Airborne contaminant management method and system
- Patent number 12,202,015
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Ming Tsao
- B08 - CLEANING
Information Patent Grant
System and method for testing a filter
- Patent number 12,105,003
- Issue date Oct 1, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method of monitoring static charge
- Patent number 12,055,575
- Issue date Aug 6, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shin-Ta Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting particles
- Patent number 12,055,509
- Issue date Aug 6, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- G01 - MEASURING TESTING
Information Patent Grant
Fluid sensor system
- Patent number 12,044,646
- Issue date Jul 23, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Measuring system and method of measuring static charges
- Patent number 12,020,962
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Tzu-Sou Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Slurry monitoring device, CMP system and method of in-line monitori...
- Patent number 11,938,586
- Issue date Mar 26, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic random access memory and manufacturing method thereof
- Patent number 11,864,466
- Issue date Jan 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shy-Jay Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filter apparatus for semiconductor device fabrication process
- Patent number 11,826,709
- Issue date Nov 28, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chwen Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of monitoring static charge
- Patent number 11,680,972
- Issue date Jun 20, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shin-Ta Wu
- G01 - MEASURING TESTING
Information Patent Grant
Detector, detection device and method of using the same
- Patent number 11,674,919
- Issue date Jun 13, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with asymmetrical pinned magnets, and method o...
- Patent number 11,678,585
- Issue date Jun 13, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Mingyuan Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing a substrate by using fluid flowing through a...
- Patent number 11,668,639
- Issue date Jun 6, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- En-Tian Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and associated operating and fabricating me...
- Patent number 11,362,268
- Issue date Jun 14, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with asymmetrical pinned magnets, and method o...
- Patent number 11,302,864
- Issue date Apr 12, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Mingyuan Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Monitoring system and method of monitoring static charge
- Patent number 11,280,823
- Issue date Mar 22, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shin-Ta Wu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic random access memory and manufacturing method thereof
- Patent number 11,075,336
- Issue date Jul 27, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shy-Jay Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detector
- Patent number 10,976,233
- Issue date Apr 13, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- En-Tian Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with asymmetrical pinned magnets, and method o...
- Patent number 10,756,255
- Issue date Aug 25, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Mingyuan Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor structure and associated operating and fabricating me...
- Patent number 10,680,166
- Issue date Jun 9, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic random access memory and manufacturing method thereof
- Patent number 10,541,361
- Issue date Jan 21, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chwen Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic tunnel junction memory device
- Patent number 10,438,639
- Issue date Oct 8, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chwen Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic Tunnel Junction Memory Device
- Patent number 10,283,179
- Issue date May 7, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chwen Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and associated operating and fabricating me...
- Patent number 10,276,784
- Issue date Apr 30, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive tunnel junction
- Patent number 10,115,898
- Issue date Oct 30, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chwen Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Board, semiconductor fabrication plant (FAB) and fabrication facility
- Patent number 10,104,816
- Issue date Oct 16, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chwen Yu
- G12 - INSTRUMENT DETAILS
Information Patent Grant
Elongated magnetoresistive tunnel junction structure
- Patent number 10,096,767
- Issue date Oct 9, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chwen Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic tunnel junction memory device
- Patent number 9,886,990
- Issue date Feb 6, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chwen Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic tunnel junction memory device
- Patent number 9,779,793
- Issue date Oct 3, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chwen Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Reference circuit and MRAM
- Patent number 9,734,883
- Issue date Aug 15, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chwen Yu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR SLURRY QUALITY MONITORING
- Publication number 20240375238
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHIH-CHIANG TSENG
- B24 - GRINDING POLISHING
Information Patent Application
SYSTEM AND METHOD FOR TESTING A FILTER
- Publication number 20240369465
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
FLUID SENSOR SYSTEM
- Publication number 20240337618
- Publication date Oct 10, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES
- Publication number 20240304480
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- TZU-SOU CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SLURRY MONITORING DEVICE, CMP SYSTEM AND METHOD OF IN-LINE MONITORI...
- Publication number 20240189961
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR FILTER ANALYSIS AND REGENERATION
- Publication number 20230408393
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- En Tian LIN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS
- Publication number 20230372878
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chwen YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH ASYMMETRICAL PINNED MAGNETS, AND METHOD O...
- Publication number 20230337550
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mingyuan SONG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF MONITORING STATIC CHARGE
- Publication number 20230273250
- Publication date Aug 31, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- SHIN-TA WU
- G01 - MEASURING TESTING
Information Patent Application
FILTER MEMBRANE AND METHOD FOR MAKING THE SAME
- Publication number 20230138216
- Publication date May 4, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En-Tian LIN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SLURRY MONITORING DEVICE, CMP SYSTEM AND METHOD OF IN-LINE MONITORI...
- Publication number 20230060960
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- B24 - GRINDING POLISHING
Information Patent Application
SYSTEM AND METHOD FOR TESTING A FILTER
- Publication number 20230066472
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES
- Publication number 20230063350
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- TZU-SOU CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS
- Publication number 20220379265
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chwen YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUID SENSOR SYSTEM
- Publication number 20220365019
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM FOR SLURRY QUALITY MONITORING
- Publication number 20220362902
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- CHIH-CHIANG TSENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING PARTICLES
- Publication number 20220341865
- Publication date Oct 27, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- G01 - MEASURING TESTING
Information Patent Application
AIRBORNE CONTAMINANT MANAGEMENT METHOD AND SYSTEM
- Publication number 20220297170
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Ming TSAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MONITORING STATIC CHARGE
- Publication number 20220206053
- Publication date Jun 30, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- SHIN-TA WU
- G01 - MEASURING TESTING
Information Patent Application
FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS
- Publication number 20210362291
- Publication date Nov 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chwen YU
- B24 - GRINDING POLISHING
Information Patent Application
MAGNETIC RANDOM ACCESS MEMORY AND MANUFACTURING METHOD THEREOF
- Publication number 20210351346
- Publication date Nov 11, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shy-Jay LIN
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR PROCESSING A SUBSTRATE BY USING FLUID FLOWING THROUGH A...
- Publication number 20210231553
- Publication date Jul 29, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En-Tian Lin
- G01 - MEASURING TESTING
Information Patent Application
MONITORING SYSTEM AND METHOD OF MONITORING STATIC CHARGE
- Publication number 20210123963
- Publication date Apr 29, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- SHIN-TA WU
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR, DETECTION DEVICE AND METHOD OF USING THE SAME
- Publication number 20210018457
- Publication date Jan 21, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE WITH ASYMMETRICAL PINNED MAGNETS, AND METHOD O...
- Publication number 20200350487
- Publication date Nov 5, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mingyuan SONG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE WITH ASYMMETRICAL PINNED MAGNETS, AND METHOD O...
- Publication number 20200350488
- Publication date Nov 5, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mingyuan SONG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STRUCTURE AND ASSOCIATED OPERATING AND FABRICATING ME...
- Publication number 20200279994
- Publication date Sep 3, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC RANDOM ACCESS MEMORY AND MANUFACTURING METHOD THEREOF
- Publication number 20200152865
- Publication date May 14, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shy-Jay Lin
- G11 - INFORMATION STORAGE
Information Patent Application
Particle detector
- Publication number 20200056978
- Publication date Feb 20, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- En-Tian Lin
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE WITH ASYMMETRICAL PINNED MAGNETS, AND METHOD O...
- Publication number 20190355895
- Publication date Nov 21, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mingyuan SONG
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Airborne contaminant management method and system

System and method for testing a filter

Method of monitoring static charge

Method for detecting particles

Fluid sensor system

Measuring system and method of measuring static charges

Slurry monitoring device, CMP system and method of in-line monitori...

Magnetic random access memory and manufacturing method thereof

Filter apparatus for semiconductor device fabrication process

Method of monitoring static charge

Detector, detection device and method of using the same

Semiconductor device with asymmetrical pinned magnets, and method o...

Method for processing a substrate by using fluid flowing through a...

Semiconductor structure and associated operating and fabricating me...

Semiconductor device with asymmetrical pinned magnets, and method o...

Monitoring system and method of monitoring static charge

Magnetic random access memory and manufacturing method thereof

Particle detector

Semiconductor device with asymmetrical pinned magnets, and method o...

Semiconductor structure and associated operating and fabricating me...

Magnetic random access memory and manufacturing method thereof

Magnetic tunnel junction memory device

Magnetic Tunnel Junction Memory Device

Semiconductor structure and associated operating and fabricating me...

Magnetoresistive tunnel junction

Board, semiconductor fabrication plant (FAB) and fabrication facility

Elongated magnetoresistive tunnel junction structure

Magnetic tunnel junction memory device

Magnetic tunnel junction memory device

Reference circuit and MRAM

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR SLURRY QUALITY MONITORING

SYSTEM AND METHOD FOR TESTING A FILTER

FLUID SENSOR SYSTEM

MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES

SLURRY MONITORING DEVICE, CMP SYSTEM AND METHOD OF IN-LINE MONITORI...

SYSTEM FOR FILTER ANALYSIS AND REGENERATION

FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS

SEMICONDUCTOR DEVICE WITH ASYMMETRICAL PINNED MAGNETS, AND METHOD O...

METHOD OF MONITORING STATIC CHARGE

FILTER MEMBRANE AND METHOD FOR MAKING THE SAME

SLURRY MONITORING DEVICE, CMP SYSTEM AND METHOD OF IN-LINE MONITORI...

SYSTEM AND METHOD FOR TESTING A FILTER

MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES

FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS

FLUID SENSOR SYSTEM

METHOD AND SYSTEM FOR SLURRY QUALITY MONITORING

METHOD FOR DETECTING PARTICLES

AIRBORNE CONTAMINANT MANAGEMENT METHOD AND SYSTEM

METHOD OF MONITORING STATIC CHARGE

FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS

MAGNETIC RANDOM ACCESS MEMORY AND MANUFACTURING METHOD THEREOF

METHOD FOR PROCESSING A SUBSTRATE BY USING FLUID FLOWING THROUGH A...

MONITORING SYSTEM AND METHOD OF MONITORING STATIC CHARGE

DETECTOR, DETECTION DEVICE AND METHOD OF USING THE SAME

SEMICONDUCTOR DEVICE WITH ASYMMETRICAL PINNED MAGNETS, AND METHOD O...

SEMICONDUCTOR DEVICE WITH ASYMMETRICAL PINNED MAGNETS, AND METHOD O...

SEMICONDUCTOR STRUCTURE AND ASSOCIATED OPERATING AND FABRICATING ME...

MAGNETIC RANDOM ACCESS MEMORY AND MANUFACTURING METHOD THEREOF

Particle detector

SEMICONDUCTOR DEVICE WITH ASYMMETRICAL PINNED MAGNETS, AND METHOD O...