Claudia Fleischmann

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Leuven, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for aligning a probe for scanning probe micros...
- Patent number 11,549,963
- Issue date Jan 10, 2023
- Imec VZW
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the shape of a sample tip for atom probe tom...
- Patent number 10,746,759
- Issue date Aug 18, 2020
- Imec VZW
- Kristof Paredis
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Aligning a Probe for Scanning Probe Micros...
- Publication number 20220065895
- Publication date Mar 3, 2022
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE SHAPE OF A SAMPLE TIP FOR ATOM PROBE TOM...
- Publication number 20190277881
- Publication date Sep 12, 2019
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING