Claudio Rampoldi

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Eddy current sensor with concentric confocal distance sensor
- Patent number 7,173,417
- Issue date Feb 6, 2007
- Nanometrics Incorporated
- Jaime Poris
- G01 - MEASURING TESTING
Information Patent Grant
Leveling a measured height profile
- Patent number 6,925,860
- Issue date Aug 9, 2005
- Nanometrics Incorporated
- Jaime Poris
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining material using intensity of light
- Patent number 6,813,031
- Issue date Nov 2, 2004
- Nanometrics Incorporated
- Jaime Poris
- G01 - MEASURING TESTING
Information Patent Grant
Profiling method
- Patent number 6,633,389
- Issue date Oct 14, 2003
- Nanometrics Incorporated
- Jaime Poris
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM AND METHOD USING AN OFF-AXIS UNOBSCURED OBJECTIVE...
- Publication number 20160139032
- Publication date May 19, 2016
- KLA-Tencor Corporation
- Claudio Rampoldi
- G01 - MEASURING TESTING