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Claudio Savoia
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Milan, IT
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last 30 patents
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Patent Grant
Method of measuring the thickness of a layer of silicon damaged by...
Patent number
6,233,046
Issue date
May 15, 2001
STMicroelectronics S.r.l.
Simone Alba
G01 - MEASURING TESTING
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Patent Grant
Contact macroradiography characterization of doped optical fibers
Patent number
6,178,222
Issue date
Jan 23, 2001
STMicroelectronics S.r.l.
Claudio Savoia
B82 - NANO-TECHNOLOGY