Claus DIETRICH

Person

Thiendorf OT Sacka, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for contacting a row of contact areas with probe...
- Patent number 9,110,131
- Issue date Aug 18, 2015
- Cascade Microtech, Inc.
- Claus Dietrich
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing electronic components of a repetitive pattern un...
- Patent number 8,368,413
- Issue date Feb 5, 2013
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method for increasing the accuracy of the positioning of a first ob...
- Patent number 8,094,925
- Issue date Jan 10, 2012
- Cascade Microtech, Inc.
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe holder for a probe for testing semiconductor components
- Patent number 7,859,278
- Issue date Dec 28, 2010
- SUSS MicroTec Test Systems GmbH
- Dietmar Runge
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling the temperature of electronic...
- Patent number 7,671,615
- Issue date Mar 2, 2010
- SUSS MicroTec Tech Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING
Information Patent Grant
Probe station and method for measurements of semiconductor devices...
- Patent number 7,579,854
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jörg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing substrates
- Patent number 7,196,507
- Issue date Mar 27, 2007
- SUSS MicroTec Testsystems (GmbH)
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and prober for contacting a contact area with a contact tip
- Patent number 7,057,408
- Issue date Jun 6, 2006
- SUSS MicroTec Test Systems (GmbH)
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for testing substrates at low temperatures
- Patent number 7,046,025
- Issue date May 16, 2006
- SUSS MicroTec Testsystems GmbH
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus with loading device
- Patent number 7,038,441
- Issue date May 2, 2006
- SUSS MicroTec Testsystems GmbH
- Karsten Stoll
- G01 - MEASURING TESTING
Information Patent Grant
Substrate-holding device for testing circuit arrangements on substr...
- Patent number 6,864,676
- Issue date Mar 8, 2005
- SUSS MicroTec Testsystems (GmbH)
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Tester for pressure sensors
- Patent number 6,688,156
- Issue date Feb 10, 2004
- Karl Suss Dresden GmbH
- Claus Dietrich
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for the testing of semiconductor structures
- Patent number 6,373,272
- Issue date Apr 16, 2002
- Karl Suss Dresden GmbH
- Reinhard Welsch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE...
- Publication number 20130027070
- Publication date Jan 31, 2013
- CASCADE MICROTECH INC
- Claus Dietrich
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...
- Publication number 20110221461
- Publication date Sep 15, 2011
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INCREASING THE ACCURACY OF THE POSITIONING OF A FIRST OB...
- Publication number 20100111403
- Publication date May 6, 2010
- Stefan Schineidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
- Publication number 20100045264
- Publication date Feb 25, 2010
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A...
- Publication number 20100045265
- Publication date Feb 25, 2010
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
APPARATUS AND METHOD FOR ASSEMBLING SEVERAL SEMICONDUCTOR DEVICES O...
- Publication number 20100011569
- Publication date Jan 21, 2010
- SUSS MicroTec Test Systems GmbH
- Claus DIETRICH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method For Increasing The Accuracy Of The Positioning Of A First Ob...
- Publication number 20080298671
- Publication date Dec 4, 2008
- SUSS MicroTec Testsystems (GmbH)
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...
- Publication number 20080143365
- Publication date Jun 19, 2008
- SUSS Micro Tec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20080122465
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Dietmar RUNGE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...
- Publication number 20080042679
- Publication date Feb 21, 2008
- SUSS MicroTec Test Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING
Information Patent Application
Arrangement and method for testing substrates under load
- Publication number 20050083037
- Publication date Apr 21, 2005
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for testing substrates
- Publication number 20050083036
- Publication date Apr 21, 2005
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and prober for contacting a contact area with a contact tip
- Publication number 20050007135
- Publication date Jan 13, 2005
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Application
Method for increasing the accuracy of the positioning of a first ob...
- Publication number 20040208355
- Publication date Oct 21, 2004
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for testing movement-sensitive substrates
- Publication number 20040119492
- Publication date Jun 24, 2004
- Stefan Schneidewind
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Test apparatus with loading device
- Publication number 20040108847
- Publication date Jun 10, 2004
- Karsten Stoll
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus for testing substrates at low temperatures
- Publication number 20040070415
- Publication date Apr 15, 2004
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Application
Substrate-holding device for testing circuit arrangements on substr...
- Publication number 20020163350
- Publication date Nov 7, 2002
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
Tester for pressure sensors
- Publication number 20020152794
- Publication date Oct 24, 2002
- Claus Dietrich
- G01 - MEASURING TESTING

Claus DIETRICH

Person

Patents Grantslast 30 patents

Method and device for contacting a row of contact areas with probe...

Method for testing electronic components of a repetitive pattern un...

Method for increasing the accuracy of the positioning of a first ob...

Probe holder for a probe for testing semiconductor components

Method and apparatus for controlling the temperature of electronic...

Probe station and method for measurements of semiconductor devices...

Apparatus for testing substrates

Method and prober for contacting a contact area with a contact tip

Test apparatus for testing substrates at low temperatures

Test apparatus with loading device

Substrate-holding device for testing circuit arrangements on substr...

Tester for pressure sensors

Arrangement for the testing of semiconductor structures

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE...

METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...

METHOD FOR INCREASING THE ACCURACY OF THE POSITIONING OF A FIRST OB...

PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL

METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A...

APPARATUS AND METHOD FOR ASSEMBLING SEVERAL SEMICONDUCTOR DEVICES O...

Method For Increasing The Accuracy Of The Positioning Of A First Ob...

PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...

PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS

METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...

Arrangement and method for testing substrates under load

Apparatus for testing substrates

Method and prober for contacting a contact area with a contact tip

Method for increasing the accuracy of the positioning of a first ob...

Method and apparatus for testing movement-sensitive substrates

Test apparatus with loading device

Test apparatus for testing substrates at low temperatures

Substrate-holding device for testing circuit arrangements on substr...

Tester for pressure sensors