Clayton C. Williams

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Peekskill, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning capacitance - voltage microscopy
- Patent number 5,065,103
- Issue date Nov 12, 1991
- International Business Machines Corporation
- James A. Slinkman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particulate inspection of fluids using interferometric light measur...
- Patent number 5,061,070
- Issue date Oct 29, 1991
- International Business Machines Corporation
- John S. Batchelder
- G01 - MEASURING TESTING
Information Patent Grant
Apertureless near field optical microscope
- Patent number 4,947,034
- Issue date Aug 7, 1990
- International Business Machines Corporation
- Hemantha K. Wickramasinghe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning thermal profiler
- Patent number 4,747,698
- Issue date May 31, 1988
- International Business Machines Corp.
- Hermantha K. Wickramasinghe
- B82 - NANO-TECHNOLOGY