Clayton Covey Williams

Person

Salt Lake City, UT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometry systems and methods
- Patent number 11,162,781
- Issue date Nov 2, 2021
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry system and associated methods
- Patent number 11,009,341
- Issue date May 18, 2021
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry system and associated methods
- Patent number 10,514,250
- Issue date Dec 24, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry system and associated methods
- Patent number 10,422,630
- Issue date Sep 24, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method for height control for single electron tunneling force spect...
- Patent number 9,052,337
- Issue date Jun 9, 2015
- The University of Utah Research Foundation
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measurement of depth and energy of buried trap states in dielectric...
- Patent number 9,052,339
- Issue date Jun 9, 2015
- The University of Utah Research Foundation
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for determining dopant density in semiconducto...
- Patent number 8,315,819
- Issue date Nov 20, 2012
- Agilent Technologies, Inc.
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe characterization of surfaces
- Patent number 7,420,106
- Issue date Sep 2, 2008
- The University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling charge transfer microscope
- Patent number 6,583,412
- Issue date Jun 24, 2003
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving spatial resolution and accuracy in scanning pr...
- Patent number 6,210,982
- Issue date Apr 3, 2001
- University of Utah Research Foundation
- Clayton C. Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromachined probes for nanometer scale measurements and methods o...
- Patent number 5,969,345
- Issue date Oct 19, 1999
- University of Utah Research Foundation
- Clayton C Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Quantitative two-dimensional dopant profile measurement and inverse...
- Patent number 5,523,700
- Issue date Jun 4, 1996
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20220003540
- Publication date Jan 6, 2022
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20200096320
- Publication date Mar 26, 2020
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
- Publication number 20190353474
- Publication date Nov 21, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
- Publication number 20190162526
- Publication date May 30, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
- Publication number 20180051980
- Publication date Feb 22, 2018
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR HEIGHT CONTROL FOR SINGLE ELECTRON TUNNELING FORCE SPECT...
- Publication number 20140366228
- Publication date Dec 11, 2014
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Application
MEASUREMENT OF DEPTH AND ENERGY OF BURIED TRAP STATES IN DIELECTRIC...
- Publication number 20140345007
- Publication date Nov 20, 2014
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe characterization of surfaces
- Publication number 20060225164
- Publication date Oct 5, 2006
- The University of Utah
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Scanning tunneling charge transfer microscope
- Publication number 20020005481
- Publication date Jan 17, 2002
- Clayton C. Williams
- B82 - NANO-TECHNOLOGY

Clayton Covey Williams

Person

Patents Grantslast 30 patents

Interferometry systems and methods

Interferometry system and associated methods

Interferometry system and associated methods

Interferometry system and associated methods

Method for height control for single electron tunneling force spect...

Measurement of depth and energy of buried trap states in dielectric...

Method and apparatus for determining dopant density in semiconducto...

Scanning probe characterization of surfaces

Scanning tunneling charge transfer microscope

Method for improving spatial resolution and accuracy in scanning pr...

Micromachined probes for nanometer scale measurements and methods o...

Quantitative two-dimensional dopant profile measurement and inverse...

Patents Applicationslast 30 patents

INTERFEROMETRY SYSTEMS AND METHODS

INTERFEROMETRY SYSTEMS AND METHODS

INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS

INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS

INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS

METHOD FOR HEIGHT CONTROL FOR SINGLE ELECTRON TUNNELING FORCE SPECT...

MEASUREMENT OF DEPTH AND ENERGY OF BURIED TRAP STATES IN DIELECTRIC...

Scanning probe characterization of surfaces

Scanning tunneling charge transfer microscope