Clifford E. Baker

Person

Aloha, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic measurement instrument probe accessory offset, gain, and...
- Patent number 6,321,171
- Issue date Nov 20, 2001
- Tektronix, Inc.
- Clifford E. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Accessory with internal adjustments controlled by host
- Patent number 6,232,764
- Issue date May 15, 2001
- Tektronix, Inc.
- John B. Rettig
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated adapter for a DMM
- Patent number 6,068,400
- Issue date May 30, 2000
- Tektronix, Inc.
- Theodore G. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Banana type electrical receptacle
- Patent number 6,022,226
- Issue date Feb 8, 2000
- Tektronix, Inc.
- J. Steve Lyford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual contact banana connector
- Patent number 5,915,995
- Issue date Jun 29, 1999
- Tektronix, Inc.
- Daniel B. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Direct current measuring apparatus and method employing flux diversion
- Patent number 5,701,073
- Issue date Dec 23, 1997
- Tektronix, Inc.
- Clifford E. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Split-path linear isolation circuit apparatus and method
- Patent number 5,517,154
- Issue date May 14, 1996
- Tektronix, Inc.
- Clifford E. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Current probe
- Patent number 5,493,211
- Issue date Feb 20, 1996
- Tektronix, Inc.
- Clifford E. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Current probe
- Patent number 5,477,135
- Issue date Dec 19, 1995
- Tektronix, Inc.
- Clifford E. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating jitter
- Patent number 4,876,655
- Issue date Oct 24, 1989
- Tektronix, Inc.
- Dale E. Carlton
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope having temperature monitor and recalibration feature t...
- Patent number 4,779,039
- Issue date Oct 18, 1988
- Tektronic, Inc.
- Clifford E. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Gain selectable amplifier with resonance compensation
- Patent number 4,731,588
- Issue date Mar 15, 1988
- Tektronix, Inc.
- John L. Addis
- H03 - BASIC ELECTRONIC CIRCUITRY

Clifford E. Baker

Person

Patents Grantslast 30 patents

Electronic measurement instrument probe accessory offset, gain, and...

Accessory with internal adjustments controlled by host

Temperature compensated adapter for a DMM

Banana type electrical receptacle

Dual contact banana connector

Direct current measuring apparatus and method employing flux diversion

Split-path linear isolation circuit apparatus and method

Current probe

Current probe

Method and apparatus for evaluating jitter

Oscilloscope having temperature monitor and recalibration feature t...

Gain selectable amplifier with resonance compensation