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Clive Jones
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Austin, TX, US
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last 30 patents
Information
Patent Grant
Analysis of ion implant dosage
Patent number
6,677,168
Issue date
Jan 13, 2004
Advanced Micro Devices, Inc.
Zhiyong Zhao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming conductive interconnections on an integrated circ...
Patent number
6,579,788
Issue date
Jun 17, 2003
Advanced Micro Devices, Inc.
Clive Martin Jones
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Two-level silane nucleation for blanket tungsten deposition
Patent number
6,277,744
Issue date
Aug 21, 2001
Advanced Micro Devices, Inc.
Ting H. Yuan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of measuring dielectric layer thickness using SIMS
Patent number
6,248,603
Issue date
Jun 19, 2001
Advanced Micro Devices
Clive Martin Jones
G01 - MEASURING TESTING
Information
Patent Grant
Nitride based sidewall spaces for submicron MOSFETs
Patent number
6,242,785
Issue date
Jun 5, 2001
Advanced Micro Devices, Inc.
Tim Z. Hossain
H01 - BASIC ELECTRIC ELEMENTS