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Clyde M. Guest III
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Plano, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for locating irregular edges in image data
Patent number
7,046,837
Issue date
May 16, 2006
August Technology Corp.
Clyde Maxwell Guest
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for inspection using off-angle lighting
Patent number
7,024,031
Issue date
Apr 4, 2006
August Technology Corp.
Ramiro Castellanos-Nolasco
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting bumped wafers
Patent number
6,765,666
Issue date
Jul 20, 2004
Semiconductor Technologies & Instruments, Inc.
Clyde Maxwell Guest
G01 - MEASURING TESTING
Information
Patent Grant
System and method for locating image features
Patent number
6,744,913
Issue date
Jun 1, 2004
Semiconductor Technology & Instruments, Inc.
Clyde Maxwell Guest
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for locating irregular edges in image data
Patent number
6,459,807
Issue date
Oct 1, 2002
Semiconductor Technologies & Instruments, Inc.
Clyde Maxwell Guest
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for selection of a reference die
Patent number
6,252,981
Issue date
Jun 26, 2001
Semiconductor Technologies & Instruments, Inc.
Clyde Maxwell Guest
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device lead calibration unit
Patent number
5,838,434
Issue date
Nov 17, 1998
Semiconductor Technologies & Instruments, Inc.
David A. Skramsted
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
System and method for locating irregular edges in image data
Publication number
20020191832
Publication date
Dec 19, 2002
Clyde Maxwell Guest
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for selection of a reference die
Publication number
20010028734
Publication date
Oct 11, 2001
Clyde Maxwell Guest
G06 - COMPUTING CALCULATING COUNTING