Coen Adrianus Verschuren

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and metrology tool for determining information about a targe...
- Patent number 12,209,994
- Issue date Jan 28, 2025
- ASML Netherlands B.V.
- Zili Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection
- Patent number 11,875,966
- Issue date Jan 16, 2024
- ASML Netherlands B.V.
- Bernardo Kastrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining the combination of patterns to be applied to a substrat...
- Patent number 11,747,738
- Issue date Sep 5, 2023
- ASML Netherlands B.V.
- Coen Adrianus Verschuren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of detecting label particles
- Patent number 11,402,374
- Issue date Aug 2, 2022
- SIEMENS HEALTHINEERS NEDERLAND B.V.
- Coen Adrianus Verschuren
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Carrier for detecting label particles
- Patent number 11,243,199
- Issue date Feb 8, 2022
- SIEMENS HEALTHINEERS NEDERLAND B.V.
- Coen Adrianus Verschuren
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Pick-and-place tool having multiple pick up elements
- Patent number 11,232,960
- Issue date Jan 25, 2022
- ASML Netherlands B.V.
- Yang-Shan Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspection
- Patent number 11,094,502
- Issue date Aug 17, 2021
- ASML Netherlands B.V.
- Bernardo Kastrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for direct write maskless lithography
- Patent number 10,928,736
- Issue date Feb 23, 2021
- ASML Netherlands B.V.
- Pieter Willem Herman De Jager
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for direct write maskless lithography
- Patent number 10,712,669
- Issue date Jul 14, 2020
- ASML Netherlands B.V.
- Erwin Paul Smakman
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Metrology methods, radiation source, metrology apparatus and device...
- Patent number 10,555,407
- Issue date Feb 4, 2020
- ASML Netherlands B.V.
- Alexey Olegovich Polyakov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus for direct write maskless lithography
- Patent number 10,527,950
- Issue date Jan 7, 2020
- ASML Netherlands B.V.
- Erwin Paul Smakman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology methods, radiation source, metrology apparatus and device...
- Patent number 10,342,108
- Issue date Jul 2, 2019
- ASML Netherlands B.V.
- Alexey Olegovich Polyakov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Illumination system for a lithographic or inspection apparatus
- Patent number 10,180,630
- Issue date Jan 15, 2019
- ASML Netherlands B.V.
- Teunis Willem Tukker
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray detector with improved spatial gain uniformity and resolution...
- Patent number 9,995,831
- Issue date Jun 12, 2018
- Koninklijke Philips N.V.
- Coen Adrianus Verschuren
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system comprising beam shaping element
- Patent number 9,748,522
- Issue date Aug 29, 2017
- Philips Lighting Holding B.V.
- Coen Adrianus Verschuren
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microelectronic sensor device for detecting label particles
- Patent number 9,658,219
- Issue date May 23, 2017
- Koninklijke Philips N.V.
- Coen Adrianus Verschuren
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting module, a lamp, a luminaire and a display device
- Patent number 9,599,292
- Issue date Mar 21, 2017
- Koninklijke Philips N.V.
- Hendrik Johannes Boudewijn Jagt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sealed thin-film device as well as method of repairing, system for...
- Patent number 9,379,356
- Issue date Jun 28, 2016
- Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
- Coen Verschuren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for lighting
- Patent number 9,276,229
- Issue date Mar 1, 2016
- Koninklijke Philips N.V.
- Coen Adrianus Verschuren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light emitting module, a lamp, a luminaire and a display device
- Patent number 9,082,946
- Issue date Jul 14, 2015
- Koninklijke Philips N.V.
- Olexandr Valentynovych Vdovin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Patterned LED device, method of generating a patterning, system and...
- Patent number 9,070,902
- Issue date Jun 30, 2015
- Koninklijke Philips N.V.
- Coen A. Verschuren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sealed thin-film device, method of and system for repairing a seali...
- Patent number 9,034,663
- Issue date May 19, 2015
- Koninklijke Philips N.V.
- Coen A. Verschuren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transparent OLED device with high intensity
- Patent number 8,901,810
- Issue date Dec 2, 2014
- Koninklijke Philips N.V.
- Ties Van Bommel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Driver for an OLED device
- Patent number 8,884,848
- Issue date Nov 11, 2014
- Koninklijke Philips N.V.
- Coen A. Verschuren
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Sensor device for target particles in a sample
- Patent number 8,797,028
- Issue date Aug 5, 2014
- Koninklijke Philips N.V.
- Coen Adrianus Johannes Verschuren
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for driving an OLED device
- Patent number 8,749,166
- Issue date Jun 10, 2014
- Koninklijke Philips N.V.
- Coen Adrianus Verschuren
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device and method for lighting
- Patent number 8,680,762
- Issue date Mar 25, 2014
- Koninklijke Philips N.V.
- Coen A. Verschuren
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device, method and system for lighting
- Patent number 8,618,529
- Issue date Dec 31, 2013
- Koninklijke Philips N.V.
- Coen Adrianus Verschuren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light guide, patterned light emitting diode device, illumination sy...
- Patent number 8,605,234
- Issue date Dec 10, 2013
- Koninklijke Philips N.V.
- Coen A. Verschuren
- G02 - OPTICS
Information Patent Grant
Microelectronic sensor device for optical examinations on a wetted...
- Patent number 8,411,274
- Issue date Apr 2, 2013
- Koninklijke Philips Electronics N.V.
- Coen Adrianus Verschuren
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...
- Publication number 20240369944
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20240233305
- Publication date Jul 11, 2024
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION
- Publication number 20240186107
- Publication date Jun 6, 2024
- Bernardo KASTRUP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR ACOUSTIC METROLOGY
- Publication number 20240085379
- Publication date Mar 14, 2024
- ASML NETHERLANDS B.V.
- Mustafa Ümit ARABUL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IMAGING NONSTATIONARY OBJECT
- Publication number 20240004313
- Publication date Jan 4, 2024
- ASML NETHERLANDS B.V.
- Coen Adrianus VERSCHUREN
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAININ...
- Publication number 20230267711
- Publication date Aug 24, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20230036630
- Publication date Feb 2, 2023
- ASML NETHERLANDS B.V.
- Coen Adrianus VERSCHUREN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INCREASING CERTAINTY IN PARAMETERIZED MODEL PREDICTIONS
- Publication number 20220335290
- Publication date Oct 20, 2022
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND METROLOGY TOOL FOR DETERMINING INFORMATION ABOUT A TARGE...
- Publication number 20220283122
- Publication date Sep 8, 2022
- ASML NETHERLANDS B.V.
- Zili ZHOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION
- Publication number 20210375581
- Publication date Dec 2, 2021
- ASML NETHERLANDS B.V.
- Bernardo KASTRUP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING THE COMBINATION OF PATTERNS TO BE APPLIED TO A SUBSTRAT...
- Publication number 20190339621
- Publication date Nov 7, 2019
- ASML NETHERLANDS B.V.
- Coen Adrianus VERSCHUREN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Methods, Radiation Source, Metrology Apparatus and Device...
- Publication number 20190246480
- Publication date Aug 8, 2019
- ASML NETHERLANDS B.V.
- Alexey Olegovich POLYAKOV
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
APPARATUS FOR DIRECT WRITE MASKLESS LITHOGRAPHY
- Publication number 20190227442
- Publication date Jul 25, 2019
- ASML NETHERLANDS B.V.
- Erwin Paul SMAKMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTIPLE MINIATURE PICK UP ELEMENTS FOR A COMPONENT STACKING AND/OR...
- Publication number 20190148189
- Publication date May 16, 2019
- ASML NETHERLANDS B.V.
- Yang-Shan HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DIRECT WRITE MASKLESS LITHOGRAPHY
- Publication number 20190011841
- Publication date Jan 10, 2019
- ASML NETHERLANDS B.V.
- Pieter Willem Herman DE JAGER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION
- Publication number 20190006147
- Publication date Jan 3, 2019
- ASML NETHERLANDS B.V.
- Bernardo KASTRUP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DIRECT WRITE MASKLESS LITHOGRAPHY
- Publication number 20180373159
- Publication date Dec 27, 2018
- ASML Netherlands B.V.
- Erwin Paul SMAKMAN
- B82 - NANO-TECHNOLOGY
Information Patent Application
Metrology Methods, Radiation Source, Metrology Apparatus and Device...
- Publication number 20180220518
- Publication date Aug 2, 2018
- ASML NETHERLANDS B.V.
- Alexey Olegovich POLYAKOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Illumination System for a Lithographic or Inspection Apparatus
- Publication number 20180004095
- Publication date Jan 4, 2018
- ASML NETHERLANDS B.V.
- Teunis Willem TUKKER
- F21 - LIGHTING
Information Patent Application
METHOD OF DETECTING LABEL PARTICLES
- Publication number 20150241416
- Publication date Aug 27, 2015
- Koninklijke Philips N.V.
- Coen Adrianus Verschuren
- G01 - MEASURING TESTING
Information Patent Application
CARRIER FOR DETECTING LABEL PARTICLES
- Publication number 20150226733
- Publication date Aug 13, 2015
- Koninklijke Philips N.V.
- Coen Adrianus Verschuren
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITING MODULE, A LAMP, A LUMINAIRE AND A DISPLAY DEVICE
- Publication number 20150009649
- Publication date Jan 8, 2015
- Koninklijke Philips N.V.
- Hendrik Johannes Boudewijn Jagt
- F21 - LIGHTING
Information Patent Application
Sealed Thin-Film Device as well as Method of Repairing, System for...
- Publication number 20140346555
- Publication date Nov 27, 2014
- Coen Verschuren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT EMITTING MODULE, A LAMP, A LUMINAIRE AND A DISPLAY DEVICE
- Publication number 20130334559
- Publication date Dec 19, 2013
- Koninklijke Philips N.V.
- Olexandr Valentynovych Vdovin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transparent OLED device with high intensity
- Publication number 20130175919
- Publication date Jul 11, 2013
- Koninklijke Philips Electronics N.V.
- Ties VAN BOMMEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY DETECTOR WITH IMPROVED SPATIAL GAIN UNIFORMITY AND RESOLUTION...
- Publication number 20130037723
- Publication date Feb 14, 2013
- Koninklijke Philips Electronics N.V.
- Coen Adrianus Verschuren
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DRIVING AN OLED DEVICE
- Publication number 20120176061
- Publication date Jul 12, 2012
- Koninklijke Philips Electronics N.V.
- Coen Adrianus Verschuren
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
PATTERNING DEVICE FOR GENERATING A PATTERN IN AND/OR ON A LAYER
- Publication number 20120104284
- Publication date May 3, 2012
- Koninklijke Philips Electronics N.V.
- Coen Adrianus Verschuren
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTI-VIEW DEVICE FOR GENERATING ANIMATIONS OR THREE DIMENSIONAL IM...
- Publication number 20120099194
- Publication date Apr 26, 2012
- Koninklijke Philips Electronics N.V.
- Coen Adrianus Verschuren
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
SEALED THIN-FILM DEVICE, METHOD OF AND SYSTEM FOR REPAIRING A SEALI...
- Publication number 20120098027
- Publication date Apr 26, 2012
- Koninklijke Philips Electronics N.V.
- Coen A. Verschuren
- H01 - BASIC ELECTRIC ELEMENTS

Coen Adrianus Verschuren

Person

Patents Grantslast 30 patents

Method and metrology tool for determining information about a targe...

Method and apparatus for inspection

Determining the combination of patterns to be applied to a substrat...

Method of detecting label particles

Carrier for detecting label particles

Pick-and-place tool having multiple pick up elements

Method and apparatus for inspection

Method and apparatus for direct write maskless lithography

Method and apparatus for direct write maskless lithography

Metrology methods, radiation source, metrology apparatus and device...

Apparatus for direct write maskless lithography

Metrology methods, radiation source, metrology apparatus and device...

Illumination system for a lithographic or inspection apparatus

X-ray detector with improved spatial gain uniformity and resolution...

Illumination system comprising beam shaping element

Microelectronic sensor device for detecting label particles

Light emitting module, a lamp, a luminaire and a display device

Sealed thin-film device as well as method of repairing, system for...

Device and method for lighting

Light emitting module, a lamp, a luminaire and a display device

Patterned LED device, method of generating a patterning, system and...

Sealed thin-film device, method of and system for repairing a seali...

Transparent OLED device with high intensity

Driver for an OLED device

Sensor device for target particles in a sample

Method and device for driving an OLED device

Device and method for lighting

Device, method and system for lighting

Light guide, patterned light emitting diode device, illumination sy...

Microelectronic sensor device for optical examinations on a wetted...

Patents Applicationslast 30 patents

METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...

ALIGNING A DISTORTED IMAGE

METHOD AND APPARATUS FOR INSPECTION

METHODS AND APPARATUS FOR ACOUSTIC METROLOGY

METHOD AND APPARATUS FOR IMAGING NONSTATIONARY OBJECT

APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAININ...

ALIGNING A DISTORTED IMAGE

METHOD FOR INCREASING CERTAINTY IN PARAMETERIZED MODEL PREDICTIONS

METHOD AND METROLOGY TOOL FOR DETERMINING INFORMATION ABOUT A TARGE...

METHOD AND APPARATUS FOR INSPECTION

DETERMINING THE COMBINATION OF PATTERNS TO BE APPLIED TO A SUBSTRAT...

Metrology Methods, Radiation Source, Metrology Apparatus and Device...

APPARATUS FOR DIRECT WRITE MASKLESS LITHOGRAPHY

MULTIPLE MINIATURE PICK UP ELEMENTS FOR A COMPONENT STACKING AND/OR...

METHOD AND APPARATUS FOR DIRECT WRITE MASKLESS LITHOGRAPHY

METHOD AND APPARATUS FOR INSPECTION

METHOD AND APPARATUS FOR DIRECT WRITE MASKLESS LITHOGRAPHY

Metrology Methods, Radiation Source, Metrology Apparatus and Device...

Illumination System for a Lithographic or Inspection Apparatus

METHOD OF DETECTING LABEL PARTICLES

CARRIER FOR DETECTING LABEL PARTICLES

LIGHT EMITING MODULE, A LAMP, A LUMINAIRE AND A DISPLAY DEVICE

Sealed Thin-Film Device as well as Method of Repairing, System for...

LIGHT EMITTING MODULE, A LAMP, A LUMINAIRE AND A DISPLAY DEVICE

Transparent OLED device with high intensity

X-RAY DETECTOR WITH IMPROVED SPATIAL GAIN UNIFORMITY AND RESOLUTION...

METHOD AND DEVICE FOR DRIVING AN OLED DEVICE

PATTERNING DEVICE FOR GENERATING A PATTERN IN AND/OR ON A LAYER

MULTI-VIEW DEVICE FOR GENERATING ANIMATIONS OR THREE DIMENSIONAL IM...

SEALED THIN-FILM DEVICE, METHOD OF AND SYSTEM FOR REPAIRING A SEALI...