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Colby Steere
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Parsippany, NJ, US
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Patents Grants
last 30 patents
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Patent Grant
Apparatus for double-sided imprint lithography
Patent number
7,717,696
Issue date
May 18, 2010
Nanonex Corp.
Stephen Chou
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for measuring wafer thickness
Patent number
6,473,987
Issue date
Nov 5, 2002
Accretech USA, Inc.
Robert E. Steere
G01 - MEASURING TESTING
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Patent Grant
Wafer scrubbing machine
Patent number
6,055,694
Issue date
May 2, 2000
TSK America, Inc.
Colby R. Steere
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
ALIGN-TRANSFER-IMPRINT SYSTEM FOR IMPRINT LITHOGRPHY
Publication number
20080213418
Publication date
Sep 4, 2008
Hua Tan
B82 - NANO-TECHNOLOGY
Information
Patent Application
Apparatus for double-sided imprint lithography
Publication number
20050146078
Publication date
Jul 7, 2005
Stephen Chou
G11 - INFORMATION STORAGE