Colin August Sanford

Person

Atkinson, NH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Microwave applicator with solid-state generator power source
- Patent number 11,222,770
- Issue date Jan 11, 2022
- MKS Instruments, Inc.
- Mohammad Kamarehi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Apparatus and method for ignition of a plasma system and for monito...
- Patent number 10,910,798
- Issue date Feb 2, 2021
- MKS Instruments, Inc.
- Atul Gupta
- B08 - CLEANING
Information Patent Grant
Microwave applicator with solid-state generator power source
- Patent number 10,790,118
- Issue date Sep 29, 2020
- MKS Instruments, Inc.
- Mohammad Kamarehi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ignition of a plasma system and for monito...
- Patent number 10,505,348
- Issue date Dec 10, 2019
- MKS Instruments, Inc.
- Atul Gupta
- B08 - CLEANING
Information Patent Grant
User interface for an electron microscope
- Patent number 9,865,427
- Issue date Jan 9, 2018
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User interface for an electron microscope
- Patent number 9,025,018
- Issue date May 5, 2015
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanopore fabrication and applications thereof
- Patent number 8,894,796
- Issue date Nov 25, 2014
- The University of North Carolina at Greensboro
- Adam R Hall
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,633,451
- Issue date Jan 21, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Dual beam system
- Patent number 8,399,864
- Issue date Mar 19, 2013
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact scanning electron microscope
- Patent number 8,309,921
- Issue date Nov 13, 2012
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increasing current in charged particle sources and systems
- Patent number 8,124,941
- Issue date Feb 28, 2012
- Carl Zeiss NTS, LLC
- John A. Notte, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam system
- Patent number 8,013,311
- Issue date Sep 6, 2011
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined hardware and software instrument simulator for use as a te...
- Patent number 7,917,349
- Issue date Mar 29, 2011
- FEI Company
- Steven Berger
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Compact scanning electron microscope
- Patent number 7,906,762
- Issue date Mar 15, 2011
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam system
- Patent number 7,601,976
- Issue date Oct 13, 2009
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam system
- Patent number 7,161,159
- Issue date Jan 9, 2007
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic lens
- Patent number 6,852,982
- Issue date Feb 8, 2005
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICROWAVE APPLICATOR WITH SOLID-STATE GENERATOR POWER SOURCE
- Publication number 20210005430
- Publication date Jan 7, 2021
- MKS Instruments, Inc.
- Mohammad Kamarehi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR IGNITION OF A PLASMA SYSTEM AND FOR MONITO...
- Publication number 20200099199
- Publication date Mar 26, 2020
- MKS Instruments, Inc.
- Atul Gupta
- B08 - CLEANING
Information Patent Application
APPARATUS AND METHOD FOR IGNITION OF A PLASMA SYSTEM AND FOR MONITO...
- Publication number 20190089135
- Publication date Mar 21, 2019
- MKS Instruments, Inc.
- Atul Gupta
- B08 - CLEANING
Information Patent Application
MICROWAVE APPLICATOR WITH SOLID-STATE GENERATOR POWER SOURCE
- Publication number 20180269037
- Publication date Sep 20, 2018
- MKS Instruments, Inc.
- Mohammad Kamarehi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USER INTERFACE FOR AN ELECTRON MICROSCOPE
- Publication number 20150332891
- Publication date Nov 19, 2015
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nanopore Fabrication And Applications Thereof
- Publication number 20140319339
- Publication date Oct 30, 2014
- Adam R. Hall
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
COOLED CHARGED PARTICLE SYSTEMS AND METHODS
- Publication number 20130118184
- Publication date May 16, 2013
- CARL ZEISS NTS, LLC.
- Alexander Groholski
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20120241640
- Publication date Sep 27, 2012
- CARL ZEISS NTS, LLC.
- Billy W. Ward
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
Dual Beam System
- Publication number 20110309263
- Publication date Dec 22, 2011
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SCANNING ELECTRON MICROSCOPE
- Publication number 20110133083
- Publication date Jun 9, 2011
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact Scanning Electron Microscope
- Publication number 20100230590
- Publication date Sep 16, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
User Interface for an Electron Microscope
- Publication number 20100194874
- Publication date Aug 5, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual Beam System
- Publication number 20100025578
- Publication date Feb 4, 2010
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INCREASING CURRENT IN CHARGED PARTICLE SOURCES AND SYSTEMS
- Publication number 20100012839
- Publication date Jan 21, 2010
- Carl Zeiss SMT Inc.
- John A. Notte, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual beam system
- Publication number 20080035860
- Publication date Feb 14, 2008
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Combined hardware and software instrument simulator for use as a te...
- Publication number 20070020605
- Publication date Jan 25, 2007
- FEI Company
- Steven Berger
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Dual beam system
- Publication number 20050035291
- Publication date Feb 17, 2005
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC LENS
- Publication number 20050012049
- Publication date Jan 20, 2005
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS

Colin August Sanford

Person

Patents Grantslast 30 patents

Microwave applicator with solid-state generator power source

Apparatus and method for ignition of a plasma system and for monito...

Microwave applicator with solid-state generator power source

Apparatus and method for ignition of a plasma system and for monito...

User interface for an electron microscope

User interface for an electron microscope

Nanopore fabrication and applications thereof

Ion sources, systems and methods

Dual beam system

Compact scanning electron microscope

Increasing current in charged particle sources and systems

Dual beam system

Combined hardware and software instrument simulator for use as a te...

Compact scanning electron microscope

Dual beam system

Dual beam system

Magnetic lens

Patents Applicationslast 30 patents

MICROWAVE APPLICATOR WITH SOLID-STATE GENERATOR POWER SOURCE

APPARATUS AND METHOD FOR IGNITION OF A PLASMA SYSTEM AND FOR MONITO...

APPARATUS AND METHOD FOR IGNITION OF A PLASMA SYSTEM AND FOR MONITO...

MICROWAVE APPLICATOR WITH SOLID-STATE GENERATOR POWER SOURCE

USER INTERFACE FOR AN ELECTRON MICROSCOPE

Nanopore Fabrication And Applications Thereof

COOLED CHARGED PARTICLE SYSTEMS AND METHODS

ION SOURCES, SYSTEMS AND METHODS

Dual Beam System

COMPACT SCANNING ELECTRON MICROSCOPE

Compact Scanning Electron Microscope

User Interface for an Electron Microscope

Dual Beam System

INCREASING CURRENT IN CHARGED PARTICLE SOURCES AND SYSTEMS

Dual beam system

Combined hardware and software instrument simulator for use as a te...

Dual beam system

MAGNETIC LENS