Colin Geoffrey Trevor

Person

Pleasanton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Harmonic line noise correction for electron energy loss spectrometer
- Patent number 10,784,094
- Issue date Sep 22, 2020
- Gatan, Inc.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy loss spectrometer using direct detection sensor
- Patent number 10,535,492
- Issue date Jan 14, 2020
- Gatan, Inc.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High density fast phosphor for electron microscopy
- Patent number 10,364,390
- Issue date Jul 30, 2019
- Gatan, Inc.
- Edward Michael James
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Electron energy loss spectrometer
- Patent number 9,966,219
- Issue date May 8, 2018
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy loss spectrometer using direct detection sensor
- Patent number 9,966,220
- Issue date May 8, 2018
- Gatan, Inc.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy selecting slit and energy selective sample analysis systems...
- Patent number 7,238,938
- Issue date Jul 3, 2007
- Gatan, Inc.
- Colin Geoffrey Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-mode charged particle beam device
- Patent number 7,157,720
- Issue date Jan 2, 2007
- Ropintassco Holdings, L.P.
- Henry Shih-Ming Chao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20240201112
- Publication date Jun 20, 2024
- GATAN, INC.
- Colin Geoffrey TREVOR
- G01 - MEASURING TESTING
Information Patent Application
HARMONIC LINE NOISE CORRECTION FOR ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20190362953
- Publication date Nov 28, 2019
- GATAN, INC.
- Colin TREVOR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH DENSITY FAST PHOSPHOR FOR ELECTRON MICROSCOPY
- Publication number 20190161676
- Publication date May 30, 2019
- GATAN, INC.
- Edward Michael James
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR
- Publication number 20180240639
- Publication date Aug 23, 2018
- GATAN, INC.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20170207058
- Publication date Jul 20, 2017
- GATAN, INC.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR
- Publication number 20170207059
- Publication date Jul 20, 2017
- GATAN, INC.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy selecting slit and energy selective sample analysis systems...
- Publication number 20070018095
- Publication date Jan 25, 2007
- Colin Geoffrey Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-mode charged particle beam device
- Publication number 20050030373
- Publication date Feb 10, 2005
- Henry Shih-Ming Chao
- H01 - BASIC ELECTRIC ELEMENTS

Colin Geoffrey Trevor

Person

Patents Grantslast 30 patents

Harmonic line noise correction for electron energy loss spectrometer

Electron energy loss spectrometer using direct detection sensor

High density fast phosphor for electron microscopy

Electron energy loss spectrometer

Electron energy loss spectrometer using direct detection sensor

Energy selecting slit and energy selective sample analysis systems...

Multi-mode charged particle beam device

Patents Applicationslast 30 patents

SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER

HARMONIC LINE NOISE CORRECTION FOR ELECTRON ENERGY LOSS SPECTROMETER

HIGH DENSITY FAST PHOSPHOR FOR ELECTRON MICROSCOPY

ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR

ELECTRON ENERGY LOSS SPECTROMETER

ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR

Energy selecting slit and energy selective sample analysis systems...

Multi-mode charged particle beam device