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Colin SMITH
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Amikam, IL
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Patents Grants
last 30 patents
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Patent Grant
Metrology measuring apparatus
Patent number
10,697,907
Issue date
Jun 30, 2020
XWINSYS LTD.
Doron Reinis
G01 - MEASURING TESTING
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Patent Grant
Metrology inspection apparatus
Patent number
10,697,908
Issue date
Jun 30, 2020
XWINSYS LTD.
Doron Reinis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METROLOGY INSPECTION APPARATUS
Publication number
20180128757
Publication date
May 10, 2018
DORON REINIS
G02 - OPTICS
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Patent Application
METROLOGY MEASURING APPARATUS
Publication number
20180128756
Publication date
May 10, 2018
DORON REINIS
G02 - OPTICS