Colin SMITH

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Moshav Amikam, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for milling and imaging an object
- Patent number 8,721,907
- Issue date May 13, 2014
- Camtek Ltd.
- Dimitry Boguslavsky
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for cleaving semiconductor wafers
- Patent number 5,740,953
- Issue date Apr 21, 1998
- Sela Semiconductor Engineering Laboratories
- Colin Smith
- B28 - WORKING CEMENT, CLAY, OR STONE

Patents Applicationslast 30 patents

Information Patent Application
DIRECTED MULTI-DEFLECTED ION BEAM MILLING OF A WORK PIECE AND DETER...
- Publication number 20130180843
- Publication date Jul 18, 2013
- CAMTEK LTD
- Dimitri BOGUSLAVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MILLING AND IMAGING AN OBJECT
- Publication number 20120103938
- Publication date May 3, 2012
- Camtek LTD.
- Dimitry BOGUSLAVSKY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PREPARING A LAMELA
- Publication number 20120080406
- Publication date Apr 5, 2012
- CAMTEK LTD
- Dimitry BOGUSLAVSKY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PREPARING A SAMPLE
- Publication number 20120006786
- Publication date Jan 12, 2012
- CAMTEK LTD
- Dimitry BOGUSLAVSKY
- G01 - MEASURING TESTING
Information Patent Application
Sample Preparation for Micro-Analysis
- Publication number 20080308727
- Publication date Dec 18, 2008
- SELA SEMICONDUCTOR ENGINEERING LABORATORIES LTD.
- Dimitri Boguslavsky
- G01 - MEASURING TESTING
Information Patent Application
Directed Multi-Deflected Ion Beam Milling of a Work Piece and Deter...
- Publication number 20080078750
- Publication date Apr 3, 2008
- SELA SEMICONDUCTOR ENGINEERING LABORATORIES LTD.
- Dimitri Boguslavsky
- H01 - BASIC ELECTRIC ELEMENTS